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ADE9000ACPZ Scheda tecnica(PDF) 3 Page - Analog Devices

Il numero della parte ADE9000ACPZ
Spiegazioni elettronici  High Performance, Multiphase Energy Power Quality Monitoring IC
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Produttore elettronici  AD [Analog Devices]
Homepage  http://www.analog.com
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ADE9000ACPZ Scheda tecnica(HTML) 3 Page - Analog Devices

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ADE9000
Data Sheet
Rev. A | Page 2 of 72
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications....................................................................................... 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Typical Applications Circuit............................................................ 3
Specifications..................................................................................... 4
Timing Characteristics ................................................................ 8
Absolute Maximum Ratings............................................................ 9
Thermal Resistance ...................................................................... 9
ESD Caution.................................................................................. 9
Pin Configuration and Function Descriptions........................... 10
Typical Performance Characteristics ........................................... 12
Energy Linearity over Supply and Temperature..................... 12
Energy Error over Frequency and Power Factor.................... 15
Energy Linearity Repeatability ................................................. 16
RMS Linearity over Temperature and RMS Error over
Frequency .................................................................................... 17
Energy and RMS Linearity with Integrator On...................... 19
Energy and RMS Error over Frequency with Integrator On..... 21
Signal-to-Noise Ratio Performance......................................... 23
Test Circuit ...................................................................................... 24
Terminology.................................................................................... 25
Theory of Operation ...................................................................... 26
Measurements............................................................................. 26
Power Quality Measurements................................................... 31
Waveform Buffer ............................................................................ 35
Interrupts/Events............................................................................ 36
Accessing On-Chip Data............................................................... 37
SPI Protocol Overview .............................................................. 37
Additional Communication Verification Registers............... 37
CRC of Configuration Registers............................................... 37
Configuration Lock.................................................................... 37
Register Map ................................................................................... 38
Register Details ............................................................................... 51
Outline Dimensions....................................................................... 72
Ordering Guide .......................................................................... 72
REVISION HISTORY
6/2017—Rev. 0 to Rev. A
Changes to General Description .................................................... 1
Change to Operating Temperature Parameter, Table 3 ............... 9
Change to Temperature Section ................................................... 34
Change to Waveform Buffer Section............................................ 35
Change to Address 0x4FE, Table 6............................................... 47
1/2017—Revision 0: Initial Version


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