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SI4362 Scheda tecnica(PDF) 11 Page - Silicon Laboratories |
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SI4362 Scheda tecnica(HTML) 11 Page - Silicon Laboratories |
11 / 46 page Si4362 Rev 0.4 11 1.1. Definition of Test Conditions Production Test Conditions: TA =+25 °C. VDD =+3.3VDC. External reference signal (XOUT) = 1.0 VPP at 30 MHz, centered around 0.8 VDC. Production test schematic (unless noted otherwise). All RX input levels are referred to the input of a tuned balun connected to the RX input pins of the Si4362. Qualification Test Conditions: TA = –40 to +85 °C (Typical TA = 25 °C). VDD = +1.8 to +3.6 VDC (Typical VDD =3.3 VDC). Using RX reference design or production test schematic. All RF input and output levels referred to the pins of the Si4362 (not the RF module). |
Codice articolo simile - SI4362 |
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