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MC10H102 Scheda tecnica(PDF) 2 Page - ON Semiconductor |
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MC10H102 Scheda tecnica(HTML) 2 Page - ON Semiconductor |
2 / 4 page MC10H102 www.onsemi.com 2 Table 1. MAXIMUM RATINGS Symbol Characteristic Rating Unit VEE Power Supply (VCC = 0) −8.0 to 0 Vdc VI Input Voltage (VCC = 0) 0 to VEE Vdc Iout Output Current Continuous Surge 50 100 mA TA Operating Temperature Range 0 to +75 °C Tstg Storage Temperature Range Plastic Ceramic −55 to +150 −55 to +165 °C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. Table 2. ELECTRICAL CHARACTERISTICS (VEE = −5.2 V ±5%) (Note 1) 0° 25° 75° Symbol Characteristic Min Max Min Max Min Max Unit IE Power Supply Current − 29 − 26 − 29 mA IinH Input Current High − 425 − 265 − 265 mA IinL Input Current Low 0.5 − 0.5 − 0.3 − mA VOH High Output Voltage −1.02 −0.84 −0.98 −0.81 −0.92 −0.735 Vdc VOL Low Output Voltage −1.95 −1.63 −1.95 −1.63 −1.95 −1.60 Vdc VIH High Input Voltage −1.17 −0.84 −1.13 −0.81 −1.07 −0.735 Vdc VIL Low Input Voltage −1.95 −1.48 −1.95 −1.48 −1.95 −1.45 Vdc 1. Each MECL 10H series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 lfpm is maintained. Outputs are terminated through a 50 W resistor to −2.0 V. Table 3. AC CHARACTERISTICS 0° 25° 75° Symbol Characteristic Min Max Min Max Min Max Unit tpd Propagation Delay 0.4 1.25 0.4 1.25 0.4 1.4 ns tr Rise Time 0.5 1.5 0.5 1.6 0.55 1.7 ns tf Fall Time 0.5 1.5 0.5 1.6 0.55 1.7 ns NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. |
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