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LC75832W Scheda tecnica(PDF) 2 Page - ON Semiconductor

Il numero della parte LC75832W
Spiegazioni elettronici  General-Purpose LCD Display Driver
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LC75832E, 75832W
No.A0712-2/22
Specifications
Absolute Maximum Ratings at Ta = 25
°C, VSS = 0V
Parameter
Symbol
Conditions
Ratings
Unit
VDD max
VDD
-0.3 to +7.0
Maximum supply voltage
VLCD max
VLCD
-0.3 to +7.0
V
VIN1
CE, CL, DI, INH
-0.3 to +7.0
Input voltage
VIN2
OSC
-0.3 to VDD+0.3
V
VOUT1
OSC
-0.3 to VDD+0.3
Output voltage
VOUT2
S1 to S54, COM1, COM2, P1 to P4
-0.3 to VLCD+0.3
V
IOUT1
S1 to S54
300
μA
IOUT2
COM1, COM2
3
Output current
IOUT3
P1 to P4
5
mA
Allowable power dissipation
Pd max
Ta=105
°C
100
mW
Operating temperature
Topr
-40 to +105
°C
Storage temperature
Tstg
-55 to +125
°C
Allowable Operating Ranges at Ta = -40 to +105
°C, VSS = 0V
Ratings
Parameter
Symbol
Conditions
min
typ
max
unit
VDD
VDD
2.7
6.0
Supply voltage
VLCD
VLCD
2.7
6.0
V
VIH1
CE, CL, DI, INH
0.8VDD
6.0
Input high-level voltage
VIH2
OSC external clock operating mode
0.7VDD
VDD
V
VIL1
CE, CL, DI, INH
0
0.2VDD
Input low-level voltage
VIL2
OSC external clock operating mode
0
0.3VDD
V
Recommended external resistor
for RC oscillation
Rosc
OSC RC oscillator operating mode
39
k
Ω
Recommended external capacitor
for RC oscillation
Cosc
OSC RC oscillator operating mode
1000
pF
Guaranteed range of RC
oscillation
fosc
OSC RC oscillator operating mode
19
38
76
kHz
External clock operating frequency
fCK
OSC external clock operating mode [Figure 3]
19
38
76
kHz
External clock duty cycle
DCK
OSC external clock operating mode [Figure 3]
30
50
70
%
Data setup time
tds
CL, DI
[Figure 1][Figure 2]
160
ns
Data hold time
tdh
CL, DI
[Figure 1][Figure 2]
160
ns
CE wait time
tcp
CE, CL
[Figure 1][Figure 2]
160
ns
CE setup time
tcs
CE, CL
[Figure 1][Figure 2]
160
ns
CE hold time
tch
CE, CL
[Figure 1][Figure 2]
160
ns
High-level clock pulse width
t
φH
CL
[Figure 1][Figure 2]
160
ns
Low-level clock pulse width
t
φL
CL
[Figure 1][Figure 2]
160
ns
Rise time
tr
CE, CL, DI
[Figure 1][Figure 2]
160
ns
Fall time
tf
CE, CL, DI
[Figure 1][Figure 2]
160
ns
INH switching time
tc
INH, CE
[Figure 4] to [Figure 7]
10
μs
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.


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