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SN74LVC1G3157

SCES424J – JANUARY 2003 – REVISED JUNE 2016

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Copyright © 2003–2016, Texas Instruments Incorporated

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltages are with respect to ground unless otherwise specified.

(3)

The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.

(4)

This value is limited to 5.5 V maximum.

(5)

(6)

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

–0.5

6.5

V

–0.5

6.5

V

–0.5

V

Control input clamp current

–50

mA

I/O port diode current

±50

mA

±128

mA

±100

mA

Junction temperature

150

°C

Storage temperature

–65

150

°C

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.2 ESD Ratings

VALUE

UNIT

Electrostatic discharge

±2000

V

±1000

(1)

Implications of Slow or Floating CMOS Inputs (SCBA004).

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage

1.65

5.5

V

Switch input or output voltage

0

V

Control input voltage

0

5.5

V

High-level input voltage, control input

V

Low-level input voltage, control input

V

Δt/Δv

Input transition rise or fall rate

20

ns/V

20

10

10

Operating free-air temperature

–40

85

°C