ABSOLUTE MAXIMUM RATINGS

(1)

DAC9881

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

RELATIVE

DIFFERENTIAL

SPECIFIED

ACCURACY

NONLINEARITY

PACKAGE-

PACKAGE

TEMPERATURE

PACKAGE

PRODUCT

(LSB)

(LSB)

LEAD

DESIGNATOR

RANGE

MARKING

DAC9881S

±3

–1/+2

QFN-24

RGE

–40°C to +105°C

DAC9881

DAC9881SB

±2

±1

QFN-24

RGE

–40°C to +105°C

DAC9881B

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI

website at www.ti.com.

Over operating free-air temperature range (unless otherwise noted).

PARAMETER

DAC9881

UNIT

–0.3 to 6

V

–0.3 to 6

V

Digital input voltage to DGND

V

V

Operating temperature range

–40 to +105

°C

Storage temperature range

–65 to +150

°C

+150

°C

Thermal impedance (

θ

46

°C/W

Human body model (HBM)

3000

V

ESD ratings

Charged device model (CDM)

1000

V

(1)

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

2

Submit Documentation Feedback

Copyright © 2008, Texas Instruments Incorporated

Product Folder Link(s): DAC9881