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CD74ACT02MG4 Scheda tecnica(PDF) 1 Page - Texas Instruments |
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CD74ACT02MG4 Scheda tecnica(HTML) 1 Page - Texas Instruments |
1 / 13 page CD54ACT02, CD74ACT02 QUADRUPLE 2-INPUT POSITIVE-NOR GATES SCHS309B – JANUARY 2001 – REVISED MAY 2002 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Inputs Are TTL-Voltage Compatible D Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption D Balanced Propagation Delays D ±24-mA Output Drive Current – Fanout to 15 F Devices D SCR-Latchup-Resistant CMOS Process and Circuit Design D Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015 description The ’ACT02 devices contain four independent 2-input NOR gates that perform the Boolean function Y = A S B or Y = A + B in positive logic. ORDERING INFORMATION TA PACKAGE† ORDERABLE PART NUMBER TOP-SIDE MARKING PDIP – E Tube CD74ACT02E CD74ACT02E 55 °Cto125°C SOIC M Tube CD74ACT02M ACT02M –55 °C to 125°C SOIC – M Tape and reel CD74ACT02M96 ACT02M CDIP – F Tube CD54ACT02F3A CD54ACT02F3A † Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (each gate) INPUTS OUTPUT A B Y H X L X HL L L H logic diagram (positive logic) 2 1A 3 1B 1Y 1 8 3A 9 3B 3Y 10 5 2A 6 2B 2Y 4 11 4A 12 4B 4Y 13 Copyright 2002, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 1 2 3 4 5 6 7 14 13 12 11 10 9 8 1Y 1A 1B 2Y 2A 2B GND VCC 4Y 4B 4A 3Y 3B 3A CD54ACT02 ...F PACKAGE CD74ACT02 ...E OR M PACKAGE (TOP VIEW) On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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