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ABSOLUTE MAXIMUM RATINGS

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DAC7551

SLAS441E – MARCH 2005 – REVISED APRIL 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

SPECIFIED

PACKAGE

TEMPERATURE

PACKAGE

PRODUCT

PACKAGE-LEAD

DESIGNATOR

RANGE

MARKING

DAC7551

SON-12

DRN

–40

°C to +105°C

D51

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For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

website at www.ti.com.

Over operating free-air temperature range (unless otherwise noted).

UNIT

–0.3V to 6V

Digital input voltage to GND

Operating temperature range

–40

°C to +105°C

Storage temperature range

–65

°C to +150°C

+150

°C

Power dissipation (DRN)

Thermal impedance,

θ

JA

79

°C/W

Thermal impedance,

θ

JC

48.57

°C/W

Human body model (HBM)

4000V

ESD rating

Charged device model (CDM)

1500V

(1)

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

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