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LM2936MMX-5.0 Scheda tecnica(PDF) 6 Page - Texas Instruments |
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LM2936MMX-5.0 Scheda tecnica(HTML) 6 Page - Texas Instruments |
6 / 34 page LM2936 SNOSC48O – JUNE 2000 – REVISED DECEMBER 2014 www.ti.com 6.6 Electrical Characteristics for 3.3-V LM2936 VIN = 14 V, IOUT = 10 mA, TJ = 25°C, unless otherwise specified. PARAMETER TEST CONDITIONS MIN(1) TYP(2) MAX(1) UNIT 3.3-V LM2936HV ONLY Output voltage 5.5 V ≤ VIN ≤ 48 V, 100 µA ≤ IOUT ≤ 50 mA, (3) 3.201 3.300 3.399 V –40°C ≤ TJ ≤ 125°C Line regulation 6 V ≤ VIN ≤ 60 V, IOUT = 1 mA 10 30 mV ALL 3.3-V LM2936 3.234 3.300 3.366 Output voltage V 4 V ≤ VIN ≤ 26 V, 100 µA ≤ IOUT ≤ 50 mA, (3) 3.201 3.300 3.399 –40°C ≤ TJ ≤ 125°C Quiescent current IOUT = 100 μA, 8 V ≤ VIN ≤ 24 V 15 20 μA IOUT = 10 mA, 8 V ≤ VIN ≤ 24 V 0.2 0.5 mA IOUT = 50 mA, 8 V ≤ VIN ≤ 24 V 1.5 2.5 mA Line regulation 9 V ≤ VIN ≤ 16 V 5 10 mV 6 V ≤ VIN ≤ 40 V, IOUT = 1 mA 10 30 Load regulation 100 μA ≤ IOUT ≤ 5 mA 10 30 mV 5 mA ≤ IOUT ≤ 50 mA 10 30 Dropout voltage IOUT = 100 μA 0.05 0.10 V IOUT = 50 mA 0.2 0.4 V Short-circuit current VOUT = 0 V 65 120 250 mA Output impedance IOUT = 30 mAdc and 10 mArms, ƒ = 1000 Hz 450 m Ω Output noise voltage 10 Hz–100 kHz 500 μV Long-term stability 20 mV/1000 Hr Ripple rejection Vripple = 1 Vrms, ƒripple = 120 Hz −40 −60 dB Reverse polarity RL = 500 Ω, T = 1 ms −50 −80 V transient input voltage Output voltage with VIN = −15 V, RL = 500 Ω 0 −0.3 V reverse polarity input maximum line transient RL = 500 Ω, VOUT ≤ 3.63 V, T = 40 ms 60 V Output bypass COUT = 22 µF, 0.1 mA ≤ IOUT ≤ 50 mA 0.3 8 Ω capacitance (COUT) ESR SHUTDOWN INPUT − 3.3-V LM2936BM ONLY Output voltage, VOUT Output off, VSD = 2.4 V, RLOAD = 500 Ω 0 0.01 V Shutdown high Output off, RLOAD = 500 Ω 2 1.1 V threshold voltage, VIH Shutdown low Output on, RLOAD = 500 Ω 1.1 0.6 V threshold voltage, VIL Shutdown high Output off, VSD = 2.4V, RLOAD = 500 Ω 12 μA current, IIH Quiescent current Output off, VSD = 2.4V, RLOAD = 500 Ω, 30 μA includes IIH current (1) Datasheet min/max specification limits are ensured by design, test, or statistical analysis. (2) Typicals are at 25°C (unless otherwise specified) and represent the most likely parametric norm. (3) To ensure constant junction temperature, pulse testing is used. 6 Submit Documentation Feedback Copyright © 2000–2014, Texas Instruments Incorporated Product Folder Links: LM2936 |
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