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74HC_HCT3G07 Scheda tecnica(PDF) 7 Page - NXP Semiconductors

Il numero della parte 74HC_HCT3G07
Spiegazioni elettronici  Triple buffer with open-drain outputs
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Produttore elettronici  PHILIPS [NXP Semiconductors]
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74HC_HCT3G07
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Product data sheet
Rev. 4 — 16 December 2013
7 of 14
NXP Semiconductors
74HC3G07; 74HCT3G07
Triple buffer with open-drain outputs
Test data is given in Table 10.
Definitions for test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Fig 7.
Test circuit for measuring switching times
VM
VM
tW
tW
10 %
90 %
0 V
VI
VI
negative
pulse
positive
pulse
0 V
VM
VM
90 %
10 %
tf
tr
tr
tf
001aad983
DUT
VCC
VCC
VI
VO
RT
RL
S1
CL
open
G
Table 10.
Test data
Type
Input
Load
S1 position
VI
tr, tf
CL
RL
tPZL, tPLZ
74HC3G07
GND to VCC
 6 ns
50 pF
1 k
VCC
74HCT3G07
GND to 3 V
 6 ns
50 pF
1 k
VCC


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