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ADXRS401 Scheda tecnica(PDF) 1 Page - Analog Devices |
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ADXRS401 Scheda tecnica(HTML) 1 Page - Analog Devices |
1 / 12 page ±75°/s Single Chip Yaw Rate Gyro with Signal Conditioning ADXRS401 Rev. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 © 2004 Analog Devices, Inc. All rights reserved. FEATURES Complete rate gyroscope on a single chip Z-axis (yaw-rate) response High vibration rejection over wide frequency 2000 g powered shock survivability Self-test on digital command Temperature sensor output Precision voltage reference output Absolute rate output for precision applications 5 V single-supply operation Ultra small and light (< 0.15 cc, < 0.5 gram) APPLICATIONS GPS navigation systems Image stabilization Inertial measurement units Platform stabilization GENERAL DESCRIPTION The ADXRS401 is a functionally complete and low cost angular rate sensor (gyroscope), integrated with all of the required electronics on one chip. It is manufactured using Analog Devices’ surface-micromachining technique, the same high volume BIMOS process used for high reliability automotive airbag accelerometers. It is available in a 7 mm × 7 mm × 3 mm BGA surface-mount package. The output signal, RATEOUT (1B, 2A), is a voltage proportional to angular rate about the axis normal to the top surface of the package (see Figure 2). A single external resistor can be used to lower the scale factor. An external capacitor is used to set the bandwidth. Other external capacitors are required for operation (see Figure 1). A precision reference and a temperature output are also provided for compensation techniques. Two digital self-test inputs electromechanically excite the sensor to test proper operation of both sensors and the signal conditioning circuits. FUNCTIONAL BLOCK DIAGRAM 5G 4G 3A 5V 2G 1F 7F 6A 7D 7C 7B 1C 4A 5A 7E 6G 1D 2A 1E 3G 1B PDD 12V + ADXRS401 1 µF 22nF 100nF 22nF CP2 CP1 PGND CP4 CP3 CP5 CHARGE PUMP/REG. TEMP PTAT RATEOUT 2.5V π DEMOD RATE SENSOR SELF TEST 100nF 100nF CMID AGND AVCC ST1 ST2 CORIOLIS SIGNAL CHANNEL SSEN2 RSEN1 COUT ROUT 180k Ω 1% ≈9kΩ ±35% ≈9kΩ ±35% SUMJ 2.5V REF RESONATOR LOOP – Figure 1. |
Codice articolo simile - ADXRS401_15 |
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Descrizione simile - ADXRS401_15 |
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