Si85xx

6

Preliminary Rev. 0.4

Table 3. Insulation and Safety-Related Specifications

Parameter

Symbol

Test Condition

Value

Unit

SOIC-20

Minimum Air Gap (Clearance)

L(1O1)

7.6 min

mm

Minimum External Tracking (Creepage)

L(1O2)

7.6 min

mm

Minimum Internal Gap

(Internal Clearance)

0.2

mm

Tracking Resistance

(Comparative Tracking Index)

CTI

DIN IEC 60112/VDE 0303 Part 1

>175

V



f=1 MHz

1.4

pF

4.0

pF

Notes:

1. To determine resistance and capacitance, the Si85xx is converted into a 2-terminal device. Pins 1–10 are shorted

together to form the first terminal and pins 11–20 are shorted together to form the second terminal. The parameters are

then measured between these two terminals.

2. Measured from input pin to ground.

Table 4. IEC 60664-1 (VDE 0884 Part 2) Ratings

Parameter

Test Conditions

Specification

SOIC-20

Basic Isolation Group

Material Group

IIIa

Installation Classification

I-IV

I-IV

I-IV

I-IV

I-III