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FQD11P06TM Scheda tecnica(PDF) 5 Page - Fairchild Semiconductor |
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FQD11P06TM Scheda tecnica(HTML) 5 Page - Fairchild Semiconductor |
5 / 9 page www.fairchildsemi.com 5 Figure 12. Gate Charge Test Circuit & Waveform Figure 13. Resistive Switching Test Circuit & Waveforms Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms V VDS DS V VGS GS 10 10% % 90% 90% tt d( d(on on)) tt rr tt on on tt of offf tt d( d(of offf)) tt ff V VDD DD V VDS DS R RLL DUT DUT R RGG V VGS GS Ch Charg argee V VGS GS Q Qgg Q Qgsgs Q Qgd gd V VGS GS DU DUTT V VDS DS 300 300nF nF 50K 50KΩ Ω 200n 200nFF 12V 12V Sam Samee TTyype pe as as DU DUTT E E EAS AS AS ---- === 2 1 2 1 2 1 2 1 --- --- --- --- LLL AS AS AS III BV BVDS DSS S 222 --- ------- -------- -------- --------- ----- BV BVDS DSS S -V -VDD DD V VDD DD V VDS DS BV BVDSS DSS tt pp V VDD DD IIAS AS V VDS DS (t) (t) IIDD (t(t)) Ti Tim mee DU DUTT R RGG LLL III DDD tt pp IG = const. V VGS GS V VGS GS ©2000 Fairchild Semiconductor Corporation FQD11P06 / FQU11P06 Rev. C2 |
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