Motore di ricerca datesheet componenti elettronici
  Italian  ▼
ALLDATASHEETIT.COM

X  

AD677JNZ Scheda tecnica(PDF) 9 Page - Analog Devices

Il numero della parte AD677JNZ
Spiegazioni elettronici  MICROCIRCUIT, DIGITAL-LINEAR, FAST, SERIAL, 16-BIT, A/D CONVERTER, MULTICHIP SILICON
Download  12 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Produttore elettronici  AD [Analog Devices]
Homepage  http://www.analog.com
Logo AD - Analog Devices

AD677JNZ Scheda tecnica(HTML) 9 Page - Analog Devices

Back Button AD677JNZ Datasheet HTML 4Page - Analog Devices AD677JNZ Datasheet HTML 5Page - Analog Devices AD677JNZ Datasheet HTML 6Page - Analog Devices AD677JNZ Datasheet HTML 7Page - Analog Devices AD677JNZ Datasheet HTML 8Page - Analog Devices AD677JNZ Datasheet HTML 9Page - Analog Devices AD677JNZ Datasheet HTML 10Page - Analog Devices AD677JNZ Datasheet HTML 11Page - Analog Devices AD677JNZ Datasheet HTML 12Page - Analog Devices  
Zoom Inzoom in Zoom Outzoom out
 9 / 12 page
background image
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-95592
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
A
SHEET
9
DSCC FORM 2234
APR 97
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be
in accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
test method 1015.
(2) TA = +125
°C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table II herein.
4.2.2 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table II herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for
groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
4.4.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.


Codice articolo simile - AD677JNZ

Produttore elettroniciIl numero della parteScheda tecnicaSpiegazioni elettronici
logo
Analog Devices
AD677JN AD-AD677JN Datasheet
427Kb / 16P
   16-Bit 100 kSPS Sampling ADC
REV. A
AD677JN AD-AD677JN Datasheet
461Kb / 17P
   16-Bit 100 kSPS Sampling ADC
More results

Descrizione simile - AD677JNZ

Produttore elettroniciIl numero della parteScheda tecnicaSpiegazioni elettronici
logo
List of Unclassifed Man...
AD677JRZ ETC2-AD677JRZ Datasheet
149Kb / 12P
   MICROCIRCUIT, DIGITAL-LINEAR, FAST, SERIAL, 16-BIT, A/D CONVERTER, MULTICHIP SILICON
AD677KNZ ETC2-AD677KNZ Datasheet
149Kb / 12P
   MICROCIRCUIT, DIGITAL-LINEAR, FAST, SERIAL, 16-BIT, A/D CONVERTER, MULTICHIP SILICON
AD871SD ETC2-AD871SD Datasheet
54Kb / 12P
   MICROCIRCUIT, LINEAR, A/D CONVERTER, 12-BIT, 5 MSPS, MONOLITHIC SILICON
logo
Analog Devices
5962-91764 AD-5962-91764 Datasheet
180Kb / 15P
   MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT, QUAD
logo
List of Unclassifed Man...
AD7547JRZ ETC-AD7547JRZ Datasheet
134Kb / 12P
   MICROCIRCUIT, LIINEAR, DUAL, CMOS, 12-BIT, D/A CONVERTER, MONOLITHIC SILICON
logo
Sanyo Semicon Device
LC78817 SANYO-LC78817 Datasheet
137Kb / 6P
   16-Bit D/A Converter for Digital Audio?
logo
List of Unclassifed Man...
AD7890AN ETC2-AD7890AN Datasheet
117Kb / 17P
   MICROCIRCUIT, LINEAR, 8-CHANNEL, 12-BIT SERIAL, DATA ACQUISITION SYSTEM, MONOLITHIC SILICON
logo
Zilog, Inc.
Z8927320VSG ZILOG-Z8927320VSG Datasheet
988Kb / 60P
   16-BIT DIGITAL SIGNAL PROCESSORS WITH A/D CONVERTER
Z89223 ZILOG-Z89223 Datasheet
865Kb / 60P
   16-BIT DIGITAL SIGNAL PROCESSORS WITH A/D CONVERTER
Z8927320VSC ZILOG-Z8927320VSC Datasheet
988Kb / 60P
   16-BIT DIGITAL SIGNAL PROCESSORS WITH A/D CONVERTER
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12


Scheda tecnica Scarica

Go To PDF Page


Link URL




Privacy Policy
ALLDATASHEETIT.COM
Lei ha avuto il aiuto da alldatasheet?  [ DONATE ] 

Di alldatasheet   |   Richest di pubblicita   |   contatti   |   Privacy Policy   |   scambio Link   |   Ricerca produttore
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com