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2SD1628G-TD-H Scheda tecnica(PDF) 2 Page - ON Semiconductor

Il numero della parte 2SD1628G-TD-H
Spiegazioni elettronici  Bipolar Transistor20V, 5A, Low VCE(sat), NPN Single PCP
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Produttore elettronici  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
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2SD1628G-TD-H Scheda tecnica(HTML) 2 Page - ON Semiconductor

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2SD1628
No.1781-2/6
Continued from preceding page.
Parameter
Symbol
Conditions
Ratings
Unit
Collector Dissipation
PC
500
mW
When mounted on ceramic substrate (250mm2×0.8mm)
1.5
W
Junction Temperature
Tj
150
°C
Storage Temperature
Tstg
--55 to +150
°C
Electrical Characteristics at Ta=25°C
Parameter
Symbol
Conditions
Ratings
Unit
min
typ
max
Collector Cutoff Current
ICBO
VCB=50V, IE=0A
100
nA
Emitter Cutoff Current
IEBO
VEB=5V, IC=0A
100
nA
DC Current Gain
hFE1VCE=2V, IC=0.5A
120*
560*
hFE2VCE=2V, IC=3A
95
Gain-Bandwidth Product
fT
VCE=10V, IC=50mA
120
MHz
Output Capacitance
Cob
VCB=10V, f=1MHz
45
pF
Collector-to-Emitter Saturation Voltage
VCE(sat)
IC=3A, IB=60mA
500
mV
Base-to-Emitter Saturation Voltage
VBE(sat)
IC=3A, IB=60mA
1.5
V
Turn-ON Time
ton
See specified Test Circuit.
30
ns
Storage Time
tstg
300
ns
Fall Time
tf
40
ns
* : The 2SD1628 is classified by 0.5A hFE as follows :
Rank
E
F
G
hFE
120 to 200
160 to 320
280 to 560
Switching Time Test Circuit
Ordering Information
Device
Package
Shipping
memo
2SD1628G-TD-E
PCP
1,000pcs./reel
Pb Free
2SD1628G-TD-H
PCP
1,000pcs./reel
Pb Free and Halogen Free
2SD1628F-TD-E
PCP
1,000pcs./reel
Pb Free
2SD1628F-TD-H
PCP
1,000pcs./reel
Pb Free and Halogen Free
IC -- VCE
Collector-to-Emitter Current, VCE -- V
IC -- VCE
Collector-to-Emitter Voltage, VCE -- V
5
4
3
2
1
0
0
0.2
0.4
0.8
0.6
1.0
ITR10003
IB=0
5mA
10mA
15mA
20mA
30mA
40mA
60mA
2.0
1.6
1.2
0.8
0.4
0
0
0.4
0.8
1.6
1.2
2.0
ITR10004
IB=0
2mA
4mA
6mA
8mA
pulse
pulse
200VR
1μF
1μF
PW=10μs
D.C.=2%
tr, tf ≤ 7ms
IC=10IB1= --10IB2=2A
VBE= --5V
50Ω
INPUT
OUTPUT
IB1
IB2
VCC=10V
+
+
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.


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