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LM35CAH Scheda tecnica(PDF) 4 Page - Texas Instruments

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Il numero della parte LM35CAH
Spiegazioni elettronici  LM35 Precision Centigrade Temperature Sensors
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Produttore elettronici  TI1 [Texas Instruments]
Homepage  http://www.ti.com
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LM35
SNIS159C – AUGUST 1999 – REVISED JULY 2013
www.ti.com
ELECTRICAL CHARACTERISTICS
(1)(2) (continued)
LM35A
LM35CA
UNITS
PARAMETER
TEST CONDITIONS
TYP
TESTED
DESIGN
TYP
TESTED
DESIGN
(MAX.)
LIMIT(3)
LIMIT(4)
LIMIT(3)
LIMIT(4)
VS = 5 V, 25°C
56
67
56
67
VS = 5 V
105
131
91
114
Quiescent current(8)
µA
VS = 30 V, 25°C
56.2
68
56.2
68
VS = 30 V
105.5
133
91.5
116
4 V
≤ VS ≤ 30 V, 25°C
0.2
1
0.2
1
Change of quiescent
µA
current(7)
4 V
≤ VS ≤ 30 V
0.5
2
0.5
2
Temperature
+0.39
+0.5
+0.39
+0.5
coefficient of
µA/°C
quiescent current
Minimum temperature
In circuit of Figure 1, IL = 0
+1.5
+2
+1.5
+2
°C
for rate accuracy
Long term stability
TJ = TMAX, for 1000 hours
±0.08
±0.08
°C
(8)
Quiescent current is defined in the circuit of Figure 1.
ELECTRICAL CHARACTERISTICS
(1) (2)
LM35
LM35C, LM35D
UNITS
PARAMETER
TEST CONDITIONS
TYP
TESTED
DESIGN
TYP
TESTED
DESIGN
(MAX.)
LIMIT(3)
LIMIT(4)
LIMIT(3)
LIMIT(4)
TA = 25°C
±0.4
±1
±0.4
±1
TA = –10°C
±0.5
±0.5
±1.5
Accuracy, LM35,
°C
LM35C(5)
TA = TMAX
±0.8
±1.5
±0.8
±1.5
TA = TMIN
±0.8
±1.5
±0.8
±2
TA = 25°C
±0.6
±1.5
Accuracy, LM35D(5)
TA = TMAX
±0.9
±2
°C
TA = TMIN
±0.9
±2
Nonlinearity(6)
TMIN ≤ TA ≤ TMAX
±0.3
±0.5
±0.2
±0.5
°C
Sensor gain
TMIN ≤ TA ≤ TMAX
+10
+9.8,
+10
+9.8,
mV/°C
(average slope)
+10.2
+10.2
TA = 25°C
±0.4
±2
±0.4
±2
Load regulation(7)
mV/mA
0
≤ IL ≤ 1 mA
TMIN ≤ TA ≤ TMAX
±0.5
±5
±0.5
±5
TA = 25°C
±0.01
±0.1
±0.01
±0.1
Line regulation(7)
mV/V
4 V
≤ VS ≤ 30 V
±0.02
±0.2
±0.02
±0.2
(1)
Unless otherwise noted, these specifications apply:
−55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C
and LM35CA; and 0°C
≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Figure 2. These specifications also
apply from +2°C to TMAX in the circuit of Figure 1. Specifications in boldface apply over the full rated temperature range.
(2)
Specifications in boldface apply over the full rated temperature range.
(3)
Tested Limits are ensured and 100% tested in production.
(4)
Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are
not used to calculate outgoing quality levels.
(5)
Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified
conditions of voltage, current, and temperature (expressed in °C).
(6)
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated
temperature range of the device.
(7)
Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating
effects can be computed by multiplying the internal dissipation by the thermal resistance.
4
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