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OP27GJ Scheda tecnica(PDF) 2 Page - Analog Devices

Il numero della parte OP27GJ
Spiegazioni elettronici  Low-Noise, Precision Operational Amplifier
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REV. A
–2–
OP27
ELECTRICAL CHARACTERISTICS
OP27A/E
OP27F
OP27C/G
Parameter
Symbol
Conditions
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
INPUT OFFSET
VOLTAGE
1
VOS
10
25
20
60
30
100
µV
LONG-TERM VOS
STABILITY
2, 3
VOS/Time
0.2
1.0
0.3
1.5
0.4
2.0
µV/MO
INPUT OFFSET
CURRENT
IOS
7
35
9
50
12
75
nA
INPUT BIAS
CURRENT
IB
±10
±40
±12
±55
±15
±80
nA
INPUT NOISE
VOLTAGE
3, 4
en p-p
0.1 Hz to 10 Hz
0.08
0.18
0.08
0.18
0.09
0.25
µV p-p
INPUT NOISE
en
fO = 10 Hz
3.5
5.5
3.5
5.5
3.8
8.0
nV/
√Hz
Voltage Density3
fO = 30 Hz
3.1
4.5
3.1
4.5
3.3
5.6
nV/
√Hz
fO = 1000 Hz
3.0
3.8
3.0
3.8
3.2
4.5
nV/
√Hz
INPUT NOISE
in
fO = 10 Hz
1.7
4.0
1.7
4.0
1.7
pA/
√Hz
Current Density
3, 5
fO = 30 Hz
1.0
2.3
1.0
2.3
1.0
pA/
√Hz
fO = 1000 Hz
0.4
0.6
0.4
0.6
0.4
0.6
pA/
√Hz
INPUT
RESISTANCE
Differential-Mode
6
RIN
1.3
6
0.94
5
0.7
4
M
Common-Mode
RINCM
3
2.5
2
G
INPUT VOLTAGE
RANGE
IVR
±11.0 ±12.3
±11.0 ±12.3
±11.0 ±12.3
V
COMMON-MODE
REJECTION RATIO CMRR
VCM =
±11 V
114
126
106
123
100
120
dB
POWER SUPPLY
PSRR
VS =
±4 V
REJECTION RATIO
to
±18 V
1
10
1
10
2
20
µV/V
LARGE-SIGNAL
AVO
RL
≥ 2 kΩ,
VOLTAGE GAIN
VO =
±10 V
1000
1800
1000
1800
700
1500
V/mV
RL
≥ 600 Ω,
VO =
±10 V
800
1500
800
1500
600
1500
V/mV
OUTPUT
VOLTAGE SWING
VO
RL
≥ 2 kΩ±12.0 ±13.8
±12.0 ±13.8
±11.5 ±13.5
V
RL
≥ 600 Ω±10.0 ±11.5
±10.0 ±11.5
±10.0 ±11.5
V
SLEW RATE
7
SR
RL
≥ 2 kΩ
1.7
2.8
1.7
2.8
1.7
2.8
V/
µs
GAIN
BANDWIDTH
PRODUCT
7
GBW
5.0
8.0
5.0
8.0
5.0
8.0
MHz
OPEN-LOOP
OUTPUT
RESISTANCE
RO
VO = 0, IO = 0
7070
70
POWER
CONSUMPTION
Pd
VO
90
140
90
140
100
170
mW
OFFSET
ADJUSTMENT
RANGE
RP = 10 k
Ω±4.0
±4.0
±4.0
mV
NOTES
1Input offset voltage measurements are performed ~ 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.
2Long-term input offset voltage stability refers to the average trend line of V
OS versus. Time over extended periods after the first 30 days of operation. Excluding the
initial hour of operation, changes in VOS during the first 30 days are typically 2.5
µV. Refer to typical performance curve.
3Sample tested.
4See test circuit and frequency response curve for 0.1 Hz to 10 Hz tester.
5See test circuit for current noise measurement.
6Guaranteed by input bias current.
7Guaranteed by design.
(@ VS =
±15 V, TA = 25 C, unless otherwise noted.)
–SPECIFICATIONS


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