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AD678 Scheda tecnica(PDF) 5 Page - Analog Devices |
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AD678 Scheda tecnica(HTML) 5 Page - Analog Devices |
5 / 14 page AD678 REV. C –5– ORDERING GUIDE Model 1 Package Temperature Range Tested and Specified Package Option 2 AD678JN 28-Lead Plastic DIP 0 °C to +70°C AC N-28 AD678KN 28-Lead Plastic DIP 0 °C to +70°C AC + DC N-28 AD678JD 28-Lead Ceramic DIP 0 °C to +70°C AC D-28 AD678KD 28-Lead Ceramic DIP 0 °C to +70°C AC + DC D-28 AD678AD 28-Lead Ceramic DIP –40 °C to +85°C AC D-28 AD678BD 28-Lead Ceramic DIP –40 °C to +85°C AC + DC D-28 AD678AJ 44-Lead Ceramic JLCC –40 °C to +85°C AC J-44 AD678BJ 44-Lead Ceramic JLCC –40 °C to +85°C AC + DC J-44 AD678SD 28-Lead Ceramic DIP –55 °C to +125°C AC D-28 AD678TD 28-Lead Ceramic DIP –55 °C to +125°C AC + DC D-28 NOTES 1For details on grade and package offerings screened in accordance with MIL-STD-883, refer to Analog Devices Military Products Databook or /883 data sheet. 2N = Plastic DIP; D = Ceramic DIP; J = J-Leaded Ceramic Chip Carrier. ABSOLUTE MAXIMUM RATINGS* With Respect Specification To Min Max Units VCC AGND –0.3 +18 V VEE AGND –18 +0.3 V VCC VEE –0.3 +26.4 V VDD DGND 0 +7 V AGND DGND –1 +1 V AIN, REFIN AGND VEE VCC V Digital Inputs DGND –0.5 +7 V Digital Outputs DGND –0.5 VDD + 0.3 V Max Junction Temperature 175 °C Operating Temperature J and K Grades 0 +70 °C A and B Grades –40 +85 °C S and T Grades –55 +125 °C Storage Temperature –65 +150 °C Lead Temperature (10 sec max) +300 °C *Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ESD SENSITIVITY The AD678 features input protection circuitry consisting of large “distributed” diodes and polysilicon series resistors to dissipate both high energy discharges (Human Body Model) and fast, low energy pulses (Charged Device Model). Per Method 3015.2 of MIL-STD-883C, the AD678 has been classified as a Category 1 device. Proper ESD precautions are strongly recommended to avoid functional damage or performance degradation. Charges as high as 4000 volts readily accumulate on the human body and test equipment and discharge without detection. Unused devices must be stored in conductive foam or shunts, and the foam should be discharged to the destination socket before devices are removed. For further information on ESD precautions, refer to Analog Devices’ ESD Prevention Manual. AD678 CS SC OE EOCEN SYNC 12/8 EOC DB11 DB2 DB1 (R/ L) DB0 (HBE) VCC VEE VDD DGND OUTPUT REGISTER 4-BIT FLASH A/D CONVERTER CONTROL LOGIC CONVERSION LOGIC SAMPLE/ HOLD GAIN STAGE 12-BIT D/A CONVERTER VOLTAGE REF. 12 12 4 REFOUT REFIN BIPOFF AIN AGND Functional Block Diagram WARNING! ESD SENSITIVE DEVICE |
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