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SN74ABT32501 Scheda tecnica(PDF) 5 Page - Texas Instruments |
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SN74ABT32501 Scheda tecnica(HTML) 5 Page - Texas Instruments |
5 / 8 page SN54ABT32501, SN74ABT32501 36BIT UNIVERSAL BUS TRANSCEIVERS WITH 3STATE OUTPUTS SCBS229B − JUNE 1992 − REVISED NOVEMBER 1994 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251−1443 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS SN54ABT32501 SN74ABT32501 UNIT PARAMETER TEST CONDITIONS MIN TYP† MAX MIN TYP† MAX UNIT VIK VCC = 4.5 V, II = −18 mA −1.2 −1.2 V VCC = 4.5 V, IOH = − 3 mA 2.5 2.5 VOH VCC = 5 V, IOH = − 3 mA 3 3 V VOH VCC = 4.5 V IOH = − 24 mA 2 V VCC = 4.5 V IOH = − 32 mA 2 VOL VCC = 4.5 V IOL = 48 mA 0.55 0.55 V VOL VCC = 4.5 V IOL = 64 mA 0.55 V II Control inputs VCC = 0 to 5.5 V, VI = VCC or GND ±1 ±1 A II A or B ports VCC = 2.1 V to 5.5 V, VI = VCC or GND ±20 ±20 µA II(hold) A or B ports VCC = 4.5 V VI = 0.8 V 100 100 A II(hold) A or B ports VCC = 4.5 V VI = 2 V − 100 − 100 µA IOZPU‡ VCC = 0 to 2.1 V VO = 0.5 V to 2.7 V, ±50 ±50 µA IOZPD‡ VCC = 2.1 V to 0 VO = 0.5 V to 2.7 V, OE or OE = X ±50 ±50 µA IOZH§ VCC = 2.1 V to 5.5 V, VO = 2.7 V, OE ≥ 2 V, OE ≤ 0.8 V¶ 10 10 µA IOZL§ VCC = 2.1 V to 5.5 V, VO = 0.5 V, OE ≥ 2 V, OE ≤ 0.8 V¶ −10 −10 µA Ioff VCC = 0, VI or VO ≤ 4.5 V ±100 ±100 µA ICEX VCC = 5.5 V, VO = 5.5 V Outputs high 50 50 µA IO# VCC = 5.5 V, VO = 2.5 V −50 −100 −180 −50 −100 −180 mA VCC = 5.5 V, Outputs high 6 6 ICC VCC = 5.5 V, IO = 0, Outputs low 90 90 mA IO = 0, VI = VCC or GND Outputs disabled 6 6 ∆ICC|| VCC = 5.5 V, One input at 3.4 V, Other inputs at VCC or GND 1 1 mA Ci Control inputs VI = 2.5 V or 0.5 V 3.5 3.5 pF Cio A or B ports VO = 2.5 V or 0.5 V 11.5 11.5 pF † All typical values are at VCC = 5 V, TA = 25°C. ‡ This parameter is specified by characterization. § The parameters IOZH and IOZL include the input leakage current. ¶ For VCC between 2.1 V and 4 V, OE should be less than or equal to 0.5 V to ensure a low state. # Not more than one output should be tested at a time, and the duration of the test should not exceed one second. || This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND. PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. |
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