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SN74ALS1240 Scheda tecnica(PDF) 1 Page - Texas Instruments

Il numero della parte SN74ALS1240
Spiegazioni elettronici  OCTAL BUFFER AND LINE DRIVER WITH 3-STATE OUTPUTS
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Produttore elettronici  TI1 [Texas Instruments]
Homepage  http://www.ti.com
Logo TI1 - Texas Instruments

SN74ALS1240 Scheda tecnica(HTML) 1 Page - Texas Instruments

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SN74ALS1240
OCTAL BUFFER AND LINE DRIVER
WITH 3STATE OUTPUTS
SDAS054B − DECEMBER 1982 − REVISED JANUARY 1995
Copyright
1995, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251−1443
Low-Power Version of SN74ALS240A
3-State Outputs Drive Bus Lines or Buffer
Memory Address Registers
pnp Inputs Reduce dc Loading
Package Options Include Plastic
Small-Outline (DW) Packages and Standard
Plastic (N) 300-mil DIPs
description
This octal buffer and line driver is designed
specifically to improve both the performance and
density of 3-state memory address drivers, clock
drivers,
and
bus-oriented
receivers
and
transmitters. The designer has a choice of selected combinations of inverting and noninverting outputs,
symmetrical active-low output-enable (OE) inputs, and complementary OE and OE inputs. This device features
high fan-out and improved fan-in.
The SN74ALS1240 is characterized for operation from 0
°C to 70°C.
logic symbol
logic diagram (positive logic)
† This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
1
2
4
6
8
19
11
13
15
17
3
5
7
9
12
14
16
18
1A1
1A2
1A3
1A4
1Y1
2A1
2A2
2A3
2A4
2Y1
1Y2
1Y3
1Y4
2Y2
2Y3
2Y4
1OE
2OE
2
1A1
4
1A2
6
1A3
8
1A4
EN
1
1Y1
18
1Y2
16
1Y3
14
1Y4
12
11
2A1
13
2A2
15
2A3
17
2A4
EN
19
2Y1
9
2Y2
7
2Y3
5
2Y4
3
1OE
2OE
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
1OE
1A1
2Y4
1A2
2Y3
1A3
2Y2
1A4
2Y1
GND
VCC
2OE
1Y1
2A4
1Y2
2A3
1Y3
2A2
1Y4
2A1
DW OR N PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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