| Vout_normal – Vout_error | – Vout_OB

error(%) =

× 100

Vout_normal – Vout_OB

Analog

video output

Basis voltage (e.g., GND)

Vout_OB

Vout_normal

Vout_error

(Max)

Vout_error

(Min)

TC246

www.ti.com

SOCS096 – JULY 2010

OPTICAL CHARACTERISTICS (continued)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

2

%

Electronic-shutter capability

1/2000

1/30

s

Exceed 20mV

0

Dark (zone A) (see Figure 1), -15°C,

dot

CCM gain 100

12mV to 20mV

10

Illuminated (zone A) (see Figure 1), 25°C, 100-mV output

-20

20

%

-15°C, CCM gain 1000

6

mV

-15°C, CCM gain 1000

70

mV

(8)

Column uniformity is obtain by summing all the lines in the array, finding the maximum of the difference of two neighboring columns

anywhere in the array, and dividing the result by the number of lines.

(9)

There shall be no pixel defect which continued horizontally.

(10) Vertical belt noise is dark current from CMG stage, when CCD generates CMG 1000 times with -15°C at thermistor. When 0 digress,

this value is multiplied by about 2.5 times. These values are under the condition of non-aging test when factory out.

(11) Streaking is a phenomenon that pixel in the right of blight pixels which are generated by huge light intensity source responses blighter

data, when CCD generates CMG 1000 times with -15°C at thermistor. When 0°C, this value is multiplied by about 0.8 times. These

values are under the condition of non-aging test when factory out.

How to Check Pixel Error Under Blight Condition

This value is calculated using Equation 1:

(1)

Vout_xx means analog video output voltage (mV) at the several pixels. Vout_error is at error pixel, Vout_normal

is at non-error pixel, and Vout_OB is at Optical Black pixel. This test is done when CCD receives white light

whose intensity becomes about 60mV video data value at non-error pixel, which is calculated by (Vout_normal -

Vout_OB).

Figure 1. Defect Area

Copyright © 2010, Texas Instruments Incorporated

Submit Documentation Feedback

11

Product Folder Link(s): TC246