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DAC902UG4 Scheda tecnica(PDF) 2 Page - Texas Instruments

Il numero della parte DAC902UG4
Spiegazioni elettronici  12-Bit, 165MSPS DIGITAL-TO-ANALOG CONVERTER
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Produttore elettronici  TI1 [Texas Instruments]
Homepage  http://www.ti.com
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DAC902UG4 Scheda tecnica(HTML) 2 Page - Texas Instruments

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DAC902
2
SBAS094B
ELECTRICAL CHARACTERISTICS
At TA = full specified temperature range, +VA = +5V, +VD = +5V, differential transformer coupled output, 50Ω doubly terminated, unless otherwise specified.
DAC902U/E
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
RESOLUTION
12
Bits
OUTPUT UPDATE RATE
2.7V to 3.3V
125
165
MSPS
Output Update Rate (fCLOCK)
4.5V to 5.5V
165
200
MSPS
Full Specified Temperature Range, Operating
Ambient, TA
–40
+85
°C
STATIC ACCURACY(1)
TA = +25°C
Differential Nonlinearity (DNL)
fCLOCK = 25MSPS, fOUT = 1.0MHz
–1.75
±0.5
+1.75
LSB
Integral Nonlinearity (INL)
–2.5
±1.0
+2.5
LSB
DYNAMIC PERFORMANCE
TA = +25°C
Spurious-Free Dynamic Range (SFDR)
To Nyquist
fOUT = 1MHz, fCLOCK = 25MSPS
71
77
dBc
fOUT = 2.1MHz, fCLOCK = 50MSPS
75
dBc
fOUT = 5.04MHz, fCLOCK = 50MSPS
68
dBc
fOUT = 5.04MHz, fCLOCK = 100MSPS
67
dBc
fOUT = 20.2MHz, fCLOCK = 100MSPS
61
dBc
fOUT = 25.3MHz, fCLOCK = 125MSPS
61
dBc
fOUT = 41.5MHz, fCLOCK = 125MSPS
57
dBc
fOUT = 27.4MHz, fCLOCK = 165MSPS
60
dBc
fOUT = 54.8MHz, fCLOCK = 165MSPS
53
dBc
Spurious-Free Dynamic Range within a Window
fOUT = 5.04MHz, fCLOCK = 50MSPS
2MHz Span
80
dBc
fOUT = 5.04MHz, fCLOCK = 100MSPS
4MHz Span
80
dBc
Total Harmonic Distortion (THD)
fOUT = 2.1MHz, fCLOCK = 50MSPS
–74
dBc
fOUT = 2.1MHz, fCLOCK = 125MSPS
–75
dBc
Two Tone
fOUT1 = 13.5MHz, fOUT2 = 14.5MHz, fCLOCK = 100MSPS
64
dBc
ABSOLUTE MAXIMUM RATINGS
PACKAGE
SPECIFIED
DRAWING
TEMPERATURE
PACKAGE
ORDERING
TRANSPORT
PRODUCT
PACKAGE
NUMBER
RANGE
MARKING
NUMBER(1)
MEDIA
DAC902U
SO-28
217
–40
°C to +85°C
DAC902U
DAC902U
Rails
""
"
"
"
DAC902U/1K
Tape and Reel
DAC902E
TSSOP-28
360
–40
°C to +85°C
DAC902E
DAC902E
Rails
""
"
"
"
DAC902E/2K5
Tape and Reel
NOTE: (1) Models with a slash (/) are available only in Tape and Reel in the quantities indicated (e.g., /2K5 indicates 2500 devices per reel). Ordering 2500 pieces
of “DAC902E/2K5” will get a single 2500-piece Tape and Reel.
PACKAGE/ORDERING INFORMATION
+VA to AGND ........................................................................ –0.3V to +6V
+VD to DGND ........................................................................ –0.3V to +6V
AGND to DGND ................................................................. –0.3V to +0.3V
+VA to +VD ............................................................................... –6V to +6V
CLK, PD to DGND ..................................................... –0.3V to VD + 0.3V
D0-D11 to DGND ....................................................... –0.3V to VD + 0.3V
IOUT, IOUT to AGND ........................................................ –1V to VA + 0.3V
BW, BYP to AGND ..................................................... –0.3V to VA + 0.3V
REFIN, FSA to AGND ................................................. –0.3V to VA + 0.3V
INT/EXT to AGND ...................................................... –0.3V to VA + 0.3V
Junction Temperature .................................................................... +150
°C
Case Temperature ......................................................................... +100
°C
Storage Temperature .................................................................... +125
°C
DEMO BOARD
PRODUCT
ORDERING NUMBER
COMMENT
DAC902U
DEM-DAC90xU
Populated evaluation board without the DAC. Order sample of desired DAC90x model separately.
DAC902E
DEM-DAC902E
Populated evaluation board including the DAC902E.
DEMO BOARD ORDERING INFORMATION
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.


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