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ISL54222AIRUEVAL1Z Scheda tecnica(PDF) 8 Page - Intersil Corporation |
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ISL54222AIRUEVAL1Z Scheda tecnica(HTML) 8 Page - Intersil Corporation |
8 / 19 page 8 FN6902.1 February 4, 2010 FIGURE 4. CAPACITANCE TEST CIRCUIT FIGURE 5. CROSSTALK TEST CIRCUIT FIGURE 6A. MEASUREMENT POINTS FIGURE 6B. TEST CIRCUIT FIGURE 6. SKEW TEST Test Circuits and Waveforms (Continued) VDD C GND HSDxx Dx SEL IMPEDANCE ANALYZER 0V OR Repeat test for all switches. OE VDD ANALYZER VDD C HSD1x SIGNAL GENERATOR RL GND SEL Dx 50 Ω NC Dx HSD2x Signal direction through switch is reversed, worst case values are recorded. Repeat test for all switches. OE VIN DIN+ DIN- OUT+ OUT- 50% 50% 90% 10% 10% 10% 10% 90% 90% 50% 90% 50% tri tfi tro tf0 tskew_i tskew_o OUT+ CL COMD1 D2 GND VDD C D1 COMD2 CL OUT- DIN+ DIN- |tro - tri| Delay Due to Switch for Rising Input and Rising Output Signals. |tfo - tfi| Delay Due to Switch for Falling Input and Falling Output Signals. |tskew_0| Change in Skew through the Switch for Output Signals. |tskew_i| Change in Skew through the Switch for Input Signals. 15.8 Ω 15.8 Ω 143 Ω 143 Ω 45 Ω 45 Ω SEL VIN OE ISL54222A |
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