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DAC7563SDSCT Scheda tecnica(PDF) 4 Page - Texas Instruments |
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DAC7563SDSCT Scheda tecnica(HTML) 4 Page - Texas Instruments |
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4 / 56 page  DAC8562, DAC8563 DAC8162, DAC8163 DAC7562, DAC7563 SLAS719C – AUGUST 2010 – REVISED JUNE 2011 www.ti.com ELECTRICAL CHARACTERISTICS At AVDD = 2.7 V to 5.5 V and TA = –40°C to 125°C (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT STATIC PERFORMANCE(1) Resolution 16 Bits DAC856x Relative accuracy Using line passing through codes 512 and 65,024 ±4 ±12 LSB Differential nonlinearity 16-bit monotonic ±0.2 ±1 LSB Resolution 14 Bits DAC816x Relative accuracy Using line passing through codes 128 and 16,256 ±1 ±3 LSB Differential nonlinearity 14-bit monotonic ±0.1 ±0.5 LSB Resolution 12 Bits DAC756x Relative accuracy Using line passing through codes 32 and 4,064 ±0.3 ±0.75 LSB Differential nonlinearity 12-bit monotonic ±0.05 ±0.25 LSB Offset error Extrapolated from two-point line(1), unloaded ±1 ±4 mV Offset error drift ±2 µV/°C Full-scale error DAC register loaded with all 1s ±0.03 ±0.2 % FSR Zero-code error DAC register loaded with all 0s 1 4 mV Zero-code error drift ±2 µV/°C Gain error Extrapolated from two-point line(1), unloaded ±0.01 ±0.15 % FSR ppm Gain temperature coefficient ±1 FSR/ °C OUTPUT CHARACTERISTICS(2) Output voltage range 0 AVDD V DACs unloaded 7 Output voltage settling time(3) µs RL = 1 MΩ 10 Slew rate Measured between 20% - 80% of a full-scale transition 0.75 V/ µs RL = ∞ 1 Capacitive load stability nF RL = 2 kΩ 3 Code-change glitch impulse 1-LSB change around major carry 0.1 nV-s Digital feedthrough SCLK toggling, SYNC high 0.1 nV-s Power-on glitch impulse RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V 40 mV Full-scale swing on adjacent channel, 5 External reference Channel-to-channel dc crosstalk µV Full-scale swing on adjacent channel, 15 Internal reference DC output impedance At mid-scale input 5 Ω DAC outputs at full-scale, DAC outputs shorted to Short-circuit current 40 mA GND Power-up time, including settling time Coming out of power-down mode 50 µs AC PERFORMANCE(2) DAC output noise density TA = 25°C, at mid-scale input, fOUT = 1 kHz 90 nV/ √Hz DAC output noise TA = 25°C, at mid-scale input, 0.1 Hz to 10 Hz 2.6 µVPP LOGIC INPUTS(2) Input pin Leakage current –1 ±0.1 1 µA Logic input LOW voltage VINL 0 0.8 V 0.7 × Logic input HIGH voltage VINH AVDD V AVDD Pin capacitance 3 pF (1) 16-bit: codes 512 and 65,024; 14-bit: codes 128 and 16,256; 12-bit: codes 32 and 4,064 (2) Specified by design or characterization (3) Transition time between 1/4 scale and 3/4 scale including settling to within ±0.024% FSR 4 Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Link(s): DAC8562 DAC8563 DAC8162 DAC8163 DAC7562 DAC7563 |
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