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3N152 Scheda tecnica(PDF) 6 Page - RICOH electronics devices division |
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3N152 Scheda tecnica(HTML) 6 Page - RICOH electronics devices division |
6 / 19 page 12345 Rev. 1.11 - 6 - n n n n TEST CIRCUITS The typical characteristics were obtained by use of these test circuits. Test Circuit A : Typical characteristics 1), 2), 3), 4), 5), 6), 7) Test Circuit B : Typical characteristics 8) Test Circuit C : Standby Current Test Circuit D : Typical characteristics 12), 13) Test Circuit E : CE input current “H” and “L” Test Circuit F : Typical characteristics 9) Test Circuit G : Typical characteristics 10), 11) A 5 1 3 2 4 D) A) E) 1 5 3 2 V OSCILLOSCOPE SD L CL VIN 4 PMOS CIN A 5 1 3 2 4 F) 1 5 3 2 V OSCILLOSCOPE SD L CL 4 PMOS VIN CIN C) A 5 1 3 2 4 VIN VEXT VIN VOUT VIN 5 1 3 2 4 G) OSCILLOSCOPE VIN VOUT B) A 5 1 3 2 4 CIN VIN |
Codice articolo simile - 3N152 |
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Descrizione simile - 3N152 |
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