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MC74VHCT86AD Scheda tecnica(PDF) 3 Page - ON Semiconductor

Il numero della parte MC74VHCT86AD
Spiegazioni elettronici  Quad 2?묲nput XOR Gate / CMOS Logic Level Shifter with LSTTL?묬ompatible Inputs
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Produttore elettronici  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

MC74VHCT86AD Scheda tecnica(HTML) 3 Page - ON Semiconductor

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MC74VHCT86A
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3
DC ELECTRICAL CHARACTERISTICS
VCC
TA = 25°C
TA ≤ 85°C
TA ≤ 125°C
Symbol
Parameter
Test Conditions
(V)
Min
Typ
Max
Min
Max
Min
Max
Unit
VIH
Minimum High−Level
Input Voltage
3.0
4.5
5.5
1.2
2.0
2.0
1.2
2.0
2.0
1.2
2.0
2.0
V
VIL
Maximum Low−Level
Input Voltage
3.0
4.5
5.5
0.53
0.8
0.8
0.53
0.8
0.8
0.53
0.8
0.8
V
VOH
Minimum High−Level
Output Voltage
VIN = VIH or VIL
VIN = VIH or VIL
IOH = −50μA
3.0
4.5
2.9
4.4
3.0
4.5
2.9
4.4
2.9
4.4
V
VIN = VIH or VIL
IOH = −4mA
IOH = −8mA
3.0
4.5
2.58
3.94
2.48
3.80
2.34
3.66
V
VOL
Maximum Low−Level
Output Voltage
VIN = VIH or VIL
VIN = VIH or VIL
IOL = 50μA
3.0
4.5
0.0
0.0
0.1
0.1
0.1
0.1
0.1
0.1
V
VIN = VIH or VIL
IOL = 4mA
IOL = 8mA
3.0
4.5
0.36
0.36
0.44
0.44
0.52
0.52
V
IIN
Maximum Input
Leakage Current
VIN = 5.5V or GND
0 to
5.5
±0.1
±1.0
±1.0
μA
ICC
Maximum Quiescent
Supply Current
VIN = VCC or GND
5.5
2.0
20
40
μA
ICCT
Quiescent Supply
Current
Input: VIN = 3.4V
5.5
1.35
1.50
1.65
mA
IOPD
Output Leakage
Current
VOUT = 5.5V
0.0
0.5
5.0
10
μA
AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3.0ns)
Symbol
Parameter
Test Conditions
TA = 25°C
TA = − 40 to 85°C
Unit
Min
Typ
Max
Min
Max
tPLH,
tPHL
Propagation Delay,
A or B to Y
VCC = 3.3 ± 0.3V
CL = 15pF
CL = 50pF
7.0
9.5
11.0
14.5
1.0
1.0
13.0
16.5
ns
VCC = 5.0 ± 0.5V
CL = 15pF
CL = 50pF
4.8
6.3
6.8
8.8
1.0
1.0
8.0
10.0
Cin
Input Capacitance
4
10
10
pF
CPD
Power Dissipation Capacitance (Note 1)
Typical @ 25°C, VCC = 5.0V
pF
18
1. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.
Average operating current can be obtained by the equation: ICC(OPR) = CPD  VCC  fin + ICC/4 (per gate). CPD is used to determine the
no−load dynamic power consumption; PD = CPD  VCC2  fin + ICC  VCC.
3.0V
GND
50%
50% VCC
A or B
Y
tPHL
tPLH
*Includes all probe and jig capacitance
CL*
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
Figure 1. Switching Waveforms
Figure 2. Test Circuit
VOH
VOL


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