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CAT25256ZD2I-T3 Scheda tecnica(PDF) 2 Page - ON Semiconductor

Il numero della parte CAT25256ZD2I-T3
Spiegazioni elettronici  256-Kb SPI Serial CMOS EEPROM
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Produttore elettronici  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

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CAT25256
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Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
Operating Temperature
−45 to +130
°C
Storage Temperature
−65 to +150
°C
Voltage on any Pin with Respect to Ground (Note 1)
−0.5 to +6.5
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter
Min
Units
NEND (Note 3)
Endurance
1,000,000
Program / Erase Cycles
TDR
Data Retention
100
Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
3. Page Mode, VCC = 5 V, 25°C.
Table 3. D.C. OPERATING CHARACTERISTICS
(VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.)
Symbol
Parameter
Test Conditions
Min
Max
Units
ICCR
Supply Current
(Read Mode)
Read, VCC = 5.5 V,
SO open
10 MHz / −40°C to 85°C
2
mA
5 MHz / −40°C to 125°C
2
mA
ICCW
Supply Current
(Write Mode)
Write, VCC = 5.5 V,
SO open
10 MHz / −40°C to 85°C
4
mA
5 MHz / −40°C to 125°C
4
mA
ISB1
Standby Current
VIN = GND or VCC, CS = VCC,
WP = VCC, HOLD = VCC,
VCC = 5.5 V
TA = −40°C to +85°C
1
mA
TA = −40°C to +125°C
3
mA
ISB2
Standby Current
VIN = GND or VCC, CS = VCC,
WP = GND, HOLD = GND,
VCC = 5.5 V
TA = −40°C to +85°C
4
mA
TA = −40°C to +125°C
5
mA
IL
Input Leakage Current
VIN = GND or VCC
−2
2
mA
ILO
Output Leakage
Current
CS = VCC,
VOUT = GND or VCC
TA = −40°C to +85°C
−1
1
mA
TA = −40°C to +125°C
−1
2
mA
VIL
Input Low Voltage
−0.5
0.3 VCC
V
VIH
Input High Voltage
0.7 VCC
VCC + 0.5
V
VOL1
Output Low Voltage
VCC > 2.5 V, IOL = 3.0 mA
0.4
V
VOH1
Output High Voltage
VCC > 2.5 V, IOH = −1.6 mA
VCC − 0.8 V
V
VOL2
Output Low Voltage
VCC > 1.8 V, IOL = 150 mA
0.2
V
VOH2
Output High Voltage
VCC > 1.8 V, IOH = −100 mA
VCC − 0.2 V
V
Table 4. PIN CAPACITANCE (Note 2) (TA = 25°C, f = 1.0 MHz, VCC = +5.0 V)
Symbol
Test
Conditions
Min
Typ
Max
Units
COUT
Output Capacitance (SO)
VOUT = 0 V
8
pF
CIN
Input Capacitance (CS, SCK, SI, WP, HOLD)
VIN = 0 V
8
pF


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