CAT28C17ANA-20T datasheet(4/12 Pages) ONSEMI

Il numero della parte	CAT28C17ANA-20T

Spiegazioni elettronici	16 kb CMOS Parallel EEPROM

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CAT28C17A

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Table 4. RELIABILITY CHARACTERISTICS (Note 4)

Symbol

Parameter

Test Method

Min

Max

Units

NEND

Endurance

MIL−STD−883, Test Method 1033

10,000

Cycles/Byte

TDR

Data Retention

MIL−STD−883, Test Method 1008

10

Years

VZAP

ESD Susceptibility

MIL−STD−883, Test Method 3015

2,000

V

ILTH (Note 5)

Latch−Up

JEDEC Standard 17

100

mA

4. This parameter is tested initially and after a design or process change that affects the parameter.

5. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VCC + 1 V.

Table 5. D.C. OPERATING CHARACTERISTICS (VCC = 5 V ±10%, unless otherwise specified.)

Symbol

Parameter

Test Conditions

Limits

Units

Min

Typ

Max

ICC

VCC Current (Operating, TTL)

CE = OE = VIL,

f = 1/tRC min, All I/O’s Open

35

mA

ICCC (Note 6)

VCC Current (Operating, CMOS)

CE = OE = VILC,

f = 1/tRC min, All I/O’s Open

25

mA

ISB

VCC Current (Standby, TTL)

CE = VIH, All I/O’s Open

1

mA

ISBC (Note 7)

VCC Current (Standby, CMOS)

CE = VIHC, All I/O’s Open

100

mA

ILI

Input Leakage Current

VIN = GND to VCC

−10

10

mA

ILO

Output Leakage Current

VOUT = GND to VCC,

CE = VIH

−10

10

mA

VIH (Note 7)

High Level Input Voltage

2

VCC + 0.3

V

VIL (Note 6)

Low Level Input Voltage

−0.3

0.8

V

VOH

High Level Output Voltage

IOH = −400 mA

2.4

V

VOL

Low Level Output Voltage

IOL = 2.1 mA

0.4

V

VWI

Write Inhibit Voltage

3.0

V

6. VILC = −0.3 V to +0.3 V

7. VIHC = VCC −0.3 V to VCC + 0.3 V

Table 6. A.C. CHARACTERISTICS, READ CYCLE (VCC = 5 V ±10%, unless otherwise specified.)

Symbol

Parameter

28C17A−20

Units

Min

Max

tRC

Read Cycle Time

200

ns

tCE

CE Access Time

200

ns

tAA

Address Access Time

200

ns

tOE

OE Access Time

80

ns

tLZ (Note 8)

CE Low to Active Output

0

ns

tOLZ (Note 8)

OE Low to Active Output

0

ns

tHZ (Notes 8, 9)

CE High to High−Z Output

55

ns

tOHZ (Notes 8, 9)

OE High to High−Z Output

55

ns

tOH (Note 8)

Output Hold from Address Change

0

ns

8. This parameter is tested initially and after a design or process change that affects the parameter.

9. Output floating (High−Z) is defined as the state when the external data line is no longer driven by the output buffer.

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