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LS4000 Scheda tecnica(PDF) 6 Page - Power-One |
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LS4000 Scheda tecnica(HTML) 6 Page - Power-One |
6 / 27 page Cassette Style 100 Watt AC-DC Converters S Series PFC Edition 01/01.2001 6/27 Electrical Output Data General Conditions – TA = 25 °C, unless T C is specified. – Pin 18 (i) connected to pin 14 (S–/Vo1–), Uo adjusted to Uo nom (option P), R input not connected. – Sense line pins 12 (S+) and 14 (S–) connected to pins 4 (Vo1+) and 8 (Vo1–) respectively. Table 4a: Output data single output modules Output LS 4001 LS 4301 LS 4501 LS 4601 5.1 V 12.0 V 15.0 V 24.0 V Characteristics Conditions min typ max min typ max min typ max min typ max Unit Uo Output voltage Ui nom, Io nom 5.07 5.13 11.93 12.07 14.91 15.09 23.86 24.14 V Uop Overvoltage protection 7.6 21 26.5 43.5 (supressor diode) Io nom Output current 1 Ui min...Ui max 16.0 8.0 6.5 4.2 A TC min...TC max IoL Output current limit 2 Ui min...Ui max 16.2 8.2 6.7 4.4 uo 5 Output Low frequency Ui nom, Io nom 22 2 2 mVpp voltage Switching freq. IEC/EN 61204 15 5 5 5 noise Total BW = 20 MHz 50 40 40 40 DUo U Static line regulation Ui min...Ui nom, ±5 ±12 ±15 ±24 mV Ui nom...Ui max, Io nom DUo I Static load regulation Ui nom, Io = 202430 48 (0.1...1) Io nom uo d 3 Dynamic Voltage Ui nom, Io = ±170 ±150 ±150 ±100 load deviation Io nom ↔ 1/2 Io nom t d 3 regulat. Recovery time IEC/EN 61204 0.3 0.4 0.4 0.3 ms aUo Temperature coefficient Ui min...Ui max –0.5 -1.5 -1.5 1.5 mV/K of output voltage 4 0... Io nom 1 If the output voltages are increased above Uo nom through R-input control, option P setting, remote sensing or option T, the output cur- rents should be reduced accordingly so that Po nom is not exceeded. 2 See: Output Voltage Regulation of Single or Double Output Modules with Outputs 1 and 2 Connected in Series. 3 See: Typical dynamic load regulation of Uo1 and Uo2. 4 Negative temperature coefficient (0...–3 mV/cell and K) available on request. 5 Measured according to IEC/EN 61204 sub clause 3.10 with a probe acc. to annex A of the same standards. (See:Technical Informa- tion: Measuring and Testing) |
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