LSBK2640S-1 datasheet(6/6 Pages) LIGITEK

Il numero della parte	LSBK2640S-1

Spiegazioni elettronici	ROUND TYPE LED LAMPS

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Produttore elettronici	LIGITEK [LIGITEK electronics co., ltd.]

Homepage	http://www.ligitek.com

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The purpose of this is the resistance of

the device which is laid under condition

of high temperature for hours.

MIL-STD-883:1008

JIS C 7021: B-10

This test intended to determine the

thermal characteristic resistance

of the device to sudden exposures

at extreme changes in temperature

when soldering the lead wire.

This test intended to see soldering well

performed or not.

The purpose of this test is the resistance

of the device under tropical for hours.

The purpose of this is the resistance

of the device which is laid under

condition of low temperature for hours.

The purpose of this is the resistance of

the device to sudden extreme changes

in high and low temperature.

1.T.Sol=230

℃±5℃

2.Dwell time=5

±1sec

Solderability Test

1.T.Sol=260

℃±5℃

2.Dwell time= 10

±1sec.

Solder Resistance

Test

1.Ta=65

℃±5℃

2.RH=90 %~95%

3.t=240hrs

±2hrs

1.Ta=105

℃±5℃&-40℃±5℃

(10min) (10min)

2.total 10 cycles

Thermal Shock Test

High Temperature

High Humidity Test

1.Ta=-40

℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

Low Temperature

Storage Test

MIL-STD-202: 208D

MIL-STD-750: 2026

MIL-STD-883: 2003

JIS C 7021: A-2

MIL-STD-202: 210A

MIL-STD-750: 2031

JIS C 7021: A-1

MIL-STD-202: 107D

MIL-STD-750: 1051

MIL-STD-883: 1011

MIL-STD-202:103B

JIS C 7021: B-11

JIS C 7021: B-12

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

This test is conducted for the purpose

of detemining the resistance of a part

in electrical and themal stressed.

Description

Reliability Test:

1.Under Room Temperature

2.If=20mA

3.t=1000 hrs (-24hrs, +72hrs)

1.Ta=105

℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

High Temperature

Storage Test

Operating Life Test

Test Item

Test Condition

MIL-STD-750: 1026

MIL-STD-883: 1005

JIS C 7021: B-1

Reference

Standard

Page 5/5

LSBK2640S-1

PART NO.

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