LA08B-7G3H datasheet(6/6 Pages) LIGITEK

Il numero della parte	LA08B-7G3H

Spiegazioni elettronici	LED ARRAY

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Produttore elettronici	LIGITEK [LIGITEK electronics co., ltd.]

Homepage	http://www.ligitek.com

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The purpose of this test is the resistance

of the device under tropical for hous.

The purpose of this is the resistance of

the device to sudden extreme changes

in high and low temperature.

This test intended to see soldering well

performed or not.

Solder Resistance

Test

1.T.Sol=260

℃±5℃

2.Dwell time= 10

±1sec.

This test intended to determine the

thermal characteristic resistance

of the device to sudden exposures

at extreme changes in temperature

when soldering the lead wire.

Solderability Test

1.T.Sol=230

℃±5℃

2.Dwell time=5

±1sec

High Temperature

High Humidity Test

Thermal Shock Test

1.Ta=105

℃±5℃&-40℃±5℃

(10min) (10min)

2.total 10 cycles

1.Ta=65

℃±5℃

2.RH=90 %~95%

3.t=240hrs

±2hrs

MIL-STD-202: 210A

MIL-STD-750: 2031

JIS C 7021: A-1

MIL-STD-202: 208D

MIL-STD-750: 2026

MIL-STD-883: 2003

JIS C 7021: A-2

MIL-STD-202: 107D

MIL-STD-750: 1051

MIL-STD-883: 1011

MIL-STD-202:103B

JIS C 7021: B-11

LA08B/7G3H

5/5

Page

PART NO.

The purpose of this is the resistance

of the device which is laid under

condition of low temperature for hours.

The purpose of this is the resistance of

the device which is laid under ondition

of hogh temperature for hours.

This test is conducted for the purpose

of detemining the resisance of a part

in electrical and themal stressed.

1.Under Room Temperature

2.If=20mA

3.t=1000 hrs (-24hrs, +72hrs)

High Temperature

Storage Test

Operating Life Test

Low Temperature

Storage Test

1.Ta=105

℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

1.Ta=-40

℃±5℃

2.t=1000 hrs (-24hrs, +72hrs)

Reliability Test:

Test Item

Test Condition

Description

MIL-STD-750: 1026

MIL-STD-883: 1005

JIS C 7021: B-1

MIL-STD-883:1008

JIS C 7021: B-10

JIS C 7021: B-12

Reference

Standard

LIGITEK ELECTRONICS CO.,LTD.

Property of Ligitek Only

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