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ADE8052Z-DWDL1 Scheda tecnica(PDF) 8 Page - Analog Devices

Il numero della parte ADE8052Z-DWDL1
Spiegazioni elettronici  Single-Phase Energy Measurement IC with 8052 MCU, RTC, and LCD Driver
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Produttore elettronici  AD [Analog Devices]
Homepage  http://www.analog.com
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ADE5166/ADE5169
Rev. 0 | Page 8 of 148
Parameter
Min
Typ
Max
Unit
Test Conditions/Comments
POWER SUPPLY INPUTS
VDD
3.13
3.3
3.46
V
VBAT
2.4
3.3
3.7
V
INTERNAL POWER SUPPLY SWITCH (VSWOUT)
VBAT to VSWOUT On Resistance
12
Ω
VBAT = 2.4 V
VDD to VSWOUT On Resistance
9
Ω
VDD = 3.13 V
VBAT to/from VDD Switching Open Time
40
ns
BCTRL State Change and Switch Delay
18
μs
VSWOUT Output Current Drive
6
mA
POWER SUPPLY OUTPUTS
VINTA
2.3
2.70
V
VINTD
2.3
2.70
V
VINTA Power Supply Rejection
60
dB
VINTD Power Supply Rejection
50
dB
POWER SUPPLY CURRENTS
Current in Normal Mode (PSM0)
4.4
5.3
mA
fCORE = 4.096 MHz, LCD and meter active
2.2
mA
fCORE = 1.024 MHz, LCD and meter active
1.6
mA
fCORE = 32.768 kHz, LCD and meter active
3
3.9
mA
fCORE = 4.096 MHz, metering ADC and DSP
powered down
Current in PSM1
3.3
5.05
mA
fCORE = 4.096 MHz, LCD active, VBAT = 3.7 V
1
mA
fCORE = 1.024 MHz, LCD active
Current in PSM2
38
μA
LCD active with charge pump at 3.3 V + RTC,
VBAT = 3.3 V
1.7
μA
RTC only, TA = 25°C, VBAT = 3.3 V
1 Specifications guaranteed by design.
2 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
3 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Standard 22 Method A117. Retention lifetime derates with junction temperature.
4 Recommended crystal specifications.
5 Test carried out with all the I/Os set to a low output level.
6 Delay between power supply valid and execution of first instruction by 8052 core.


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