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LCDP1521 Scheda tecnica(PDF) 5 Page - STMicroelectronics |
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LCDP1521 Scheda tecnica(HTML) 5 Page - STMicroelectronics |
5 / 11 page LCDP1521 3 Functional holding current (IH) test circuit: go no-go test 5/11 2.6 Parameters related to diode and protection thyristor (Tamb = 25° C, unless otherwise specified) 3 Functional holding current (IH) test circuit: go no-go test Symbol Test conditions Typ. Max. Unit IRM VGATE / LINE = -1V VRM = -150 V VGATE / LINE = -1V VRM = -150 V Tc=25° C Tc=85° C 5 50 µA C VR = 50 V bias, VRMS = 1 V, F = 1 MHz VR = 2 V bias, VRMS = 1 V, F = 1 MHz 20 48 pF This is a GO-NO GO test which confirms the holding current (IH) level in a functional test circuit. TEST PROCEDURE : – Adjust the current level at the IH value by short circuiting the D.U.T. – Fire the D.U.T. with a surge current : IPP = 10 A, 10/1000 µs. – The D.U.T. will come back to the off-state within a duration of 50 ms max. R VBAT = - 100V Surge generator D.U.T |
Codice articolo simile - LCDP1521_06 |
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Descrizione simile - LCDP1521_06 |
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