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74LVX3245 Scheda tecnica(PDF) 6 Page - STMicroelectronics |
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74LVX3245 Scheda tecnica(HTML) 6 Page - STMicroelectronics |
6 / 13 page 74LVX3245 6/13 Table 10: Capacitive Characteristics 1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without load. (Refer to Test Circuit). Average current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/8 (per circuit) Figure 3: Test Circuit CL = 50pF or equivalent (includes jig and probe capacitance) RL = R1 = 500Ω or equivalent RT = ZOUT of pulse generator (typically 50Ω) Symbol Parameter Test Condition Value Unit VCCA (V) VCCB (V) TA = 25 °C -40 to 85 °C -55 to 125°C Min. Typ. Max. Min. Max. Min. Max. CIN Input Capacitance open open 4.5 V CI/O Input/Output Capacitance 3.3 5.0 10 V CPD Dynamic Low Level Quiet Output (note 1) A to B 3.3 5.0 55 V CPD Dynamic Low Level Quiet Output (note 1) B to A 3.3 5.0 40 V TEST SWITCH tPLH, tPHL Open tPZL, tPLZ 2VCC tPZH, tPHZ Open |
Codice articolo simile - 74LVX3245_04 |
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Descrizione simile - 74LVX3245_04 |
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