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ADE5169ASTZF62 Scheda tecnica(PDF) 9 Page - Analog Devices

Il numero della parte ADE5169ASTZF62
Spiegazioni elettronici  Single-Phase Energy Measurement IC with 8052 MCU, RTC, and LCD Driver
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Produttore elettronici  AD [Analog Devices]
Homepage  http://www.analog.com
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Preliminary Technical Data
ADE5166/ADE5169/ADE5566/ADE5569
Rev. PrB | Page 9 of 148
Parameter
Min
Typ
Max
Unit
Test Conditions/Comments
POWER SUPPLY INPUTS
VDD
3.3
V
VBAT
3.3
V
INTERNAL POWER SUPPLY SWITCH (VSWOUT)
VBAT to VSWOUT On Resistance
22
Ω
VBAT = 2.4 V
VDD to VSWOUT On Resistance
10.2
Ω
VDD = 3.13 V
VBAT
←→ VDD Switching Open Time
40
ns
BCTRL State Change and Switch Delay
18
μs
VSWOUT Output Current Drive
1
mA
POWER SUPPLY OUTPUTS
VINTA
2.5
V
VINTD
2.5
V
VINTA Power Supply Rejection
60
dB
VINTD Power Supply Rejection
50
dB
POWER SUPPLY CURRENTS
Current in Normal Mode (PSM0)
4
mA
fCORE = 4.096 MHz, LCD and meter active
2.1
mA
fCORE = 1.024 MHz, LCD and meter active
1.6
mA
fCORE = 32.768 kHz, LCD and meter active
3.2
mA
fCORE = 4.096 MHz, meter DSP active, metering ADC
powered down
3
mA
fCORE = 4.096 MHz, metering ADC and DSP powered
down
Current in PSM1
3.2
mA
fCORE = 4.096 MHz, LCD active, VBAT = 3.7 V
880
μA
fCORE = 1.024 MHz, LCD active
Current in PSM2
38
μA
LCD active with charge pump at 3.3 V + RTC
1.5
μA
RTC only, TA = 25°C, VBAT = 3.3 V
POWER SUPPLY CURRENTS
Current in Normal Mode (PSM0)
4
mA
fCORE = 4.096 MHz, LCD and meter active
1 Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
2 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Standard 22 Method A117. Retention lifetime derates with junction temperature.
3 Test carried out with all the I/Os set to a low output level.
4 Delay between power supply valid and execution of first instruction by 8052 core.


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