Motore di ricerca datesheet componenti elettronici
  Italian  ▼
ALLDATASHEETIT.COM

X  

SN74ABT18504PMG4 Scheda tecnica(PDF) 6 Page - Texas Instruments

Il numero della parte SN74ABT18504PMG4
Spiegazioni elettronici  SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
Download  34 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Produttore elettronici  TI [Texas Instruments]
Homepage  http://www.ti.com
Logo TI - Texas Instruments

SN74ABT18504PMG4 Scheda tecnica(HTML) 6 Page - Texas Instruments

Back Button SN74ABT18504PMG4 Datasheet HTML 2Page - Texas Instruments SN74ABT18504PMG4 Datasheet HTML 3Page - Texas Instruments SN74ABT18504PMG4 Datasheet HTML 4Page - Texas Instruments SN74ABT18504PMG4 Datasheet HTML 5Page - Texas Instruments SN74ABT18504PMG4 Datasheet HTML 6Page - Texas Instruments SN74ABT18504PMG4 Datasheet HTML 7Page - Texas Instruments SN74ABT18504PMG4 Datasheet HTML 8Page - Texas Instruments SN74ABT18504PMG4 Datasheet HTML 9Page - Texas Instruments SN74ABT18504PMG4 Datasheet HTML 10Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 6 / 34 page
background image
SN54ABT18504, SN74ABT18504
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS108B – AUGUST 1992 – REVISED JUNE 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
6
test architecture
Serial test information is conveyed by means of a 4-wire test bus or test access port (TAP), that conforms to IEEE
Standard 1149.1-1990. Test instructions, test data, and test control signals are all passed along this serial test
bus. The TAP controller monitors two signals from the test bus, namely TCK and TMS. The function of the TAP
controller is to extract the synchronization (TCK) and state control (TMS) signals from the test bus and generate
the appropriate on-chip control signals for the test structures in the device. Figure 1 shows the TAP controller
state diagram.
The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK and
output data changes on the falling edge of TCK. This scheme ensures that data to be captured is valid for fully
one-half of the TCK cycle.
The functional block diagram illustrates the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan
architecture and the relationship between the test bus, the TAP controller, and the test registers. As illustrated,
the device contains an 8-bit instruction register and four test data registers: an 88-bit boundary-scan register,
a 23-bit boundary-control register, a 1-bit bypass register, and a 32-bit device identification register.
Test-Logic-Reset
Run-Test/Idle
Select-DR-Scan
Capture-DR
Shift-DR
Exit1-DR
Pause-DR
Update-DR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = L
TMS = H
TMS = L
Exit2-DR
Select-IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Update-IR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-IR
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
Figure 1. TAP Controller State Diagram


Codice articolo simile - SN74ABT18504PMG4

Produttore elettroniciIl numero della parteScheda tecnicaSpiegazioni elettronici
logo
Texas Instruments
SN74ABT18504PM TI-SN74ABT18504PM Datasheet
450Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
More results

Descrizione simile - SN74ABT18504PMG4

Produttore elettroniciIl numero della parteScheda tecnicaSpiegazioni elettronici
logo
Texas Instruments
SN54ABTH18504A TI-SN54ABTH18504A_08 Datasheet
763Kb / 39P
[Old version datasheet]   SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18504A TI-SN54ABTH18504A Datasheet
547Kb / 35P
[Old version datasheet]   SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABT18504 TI-SN54ABT18504 Datasheet
450Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A_08 Datasheet
832Kb / 42P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A Datasheet
549Kb / 37P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A_07 Datasheet
802Kb / 42P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54LVTH18504A TI1-SN54LVTH18504A_12 Datasheet
881Kb / 38P
[Old version datasheet]   3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54LVTH18504A TI-SN54LVTH18504A Datasheet
544Kb / 35P
[Old version datasheet]   3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54LVTH18514 TI-SN54LVTH18514 Datasheet
548Kb / 34P
[Old version datasheet]   3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54LVTH18514 TI1-SN54LVTH18514_17 Datasheet
584Kb / 38P
[Old version datasheet]   3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34


Scheda tecnica Scarica

Go To PDF Page


Link URL




Privacy Policy
ALLDATASHEETIT.COM
Lei ha avuto il aiuto da alldatasheet?  [ DONATE ] 

Di alldatasheet   |   Richest di pubblicita   |   contatti   |   Privacy Policy   |   scambio Link   |   Ricerca produttore
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com