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M27W401-80XB6TR Scheda tecnica(PDF) 4 Page - STMicroelectronics

Il numero della parte M27W401-80XB6TR
Spiegazioni elettronici  4 Mbit 512Kb x 8 Low Voltage UV EPROM and OTP EPROM
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Produttore elettronici  STMICROELECTRONICS [STMicroelectronics]
Homepage  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

M27W401-80XB6TR Scheda tecnica(HTML) 4 Page - STMicroelectronics

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M27W401
4/15
DEVICE OPERATION
The operating modes of the M27W401 are listed in
the Operating Modes table. A single power supply
is required in the read mode. All inputs are TTL
levels except for VPP and 12V on A9 for Electronic
Signature.
Read Mode
The M27W401 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. Chip Enable (E) is the power
control and should be used for device selection.
Output Enable (G) is the output control and should
be used to gate data to the output pins, indepen-
dent of device selection. Assuming that the ad-
dresses are stable, the address access time
(tAVQV) is equal to the delay from E to output
(tELQV). Data is available at the output after a delay
of tGLQV from the falling edge of G, assuming that
E has been low and the addresses have been sta-
ble for at least tAVQV-tGLQV.
Standby Mode
The M27W401 has a standby mode which reduc-
es the supply current from 15mA to 15
µA with low
voltage operation VCC ≤ 3.6V, see Read Mode DC
Characteristics table for details. The M27W401 is
placed in the standby mode by applying a CMOS
high signal to the E input. When in the standby
mode, the outputs are in a high impedance state,
independent of the G input.
Table 5. AC Measurement Conditions
High Speed
Standard
Input Rise and Fall Times
≤ 10ns
≤ 20ns
Input Pulse Voltages
0 to 3V
0.4V to 2.4V
Input and Output Timing Ref. Voltages
1.5V
0.8V and 2V
Figure 3. AC Testing Input Output Waveform
AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
Figure 4. AC Testing Load Circuit
AI01823B
1.3V
OUT
CL
CL = 30pF for High Speed
CL = 100pF for Standard
CL includes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
Table 6. Capacitance (1) (TA =25 °C, f = 1 MHz)
Note: 1. Sampled only, not 100% tested.
Symbol
Parameter
Test Condit ion
Min
Max
Unit
CIN
Input Capacitance
VIN =0V
6pF
COUT
Output Capacitance
VOUT =0V
12
pF


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