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SA2005M Scheda tecnica(PDF) 2 Page - Sames

Il numero della parte SA2005M
Spiegazioni elettronici  Pin Selectable Three Phase Power / Energy Metering IC for Stepper Motor / Impulse Counter Applications with Anti Tamper Features
Download  12 Pages
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Produttore elettronici  SAMES [Sames]
Homepage  http://www.sames.co.za
Logo SAMES - Sames

SA2005M Scheda tecnica(HTML) 2 Page - Sames

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SA2005M
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ABSOLUTE MAXIMUM RATINGS*
Supply Voltage
V -V
3.6V
6.0
V
DD
SS
Current on any pin
I
-150
+150
mA
PIN
Storage Temperature
T
-40
+125
°C
STG
Operating Temperature
T
-40
+85
°C
O
Parameter
Symbol
Min
Max
Unit
#Extended Operating Temperature Range available on request.
*Switched to pin scan mode for 71µs.
ELECTRICAL CHARACTERISTICS
#
(V = 2.5V, V = -2.5V, over the temperature range -10°C to +70°C , unless otherwise specified.)
DD
SS
°C
V
µA
µA
T
O
V
DD
I
II
I
IV
-25
-25
-25
2.25
+25
+25
+85
2.75
Peak value
Peak value
I
= -2mA
OH
I
= 5mA
OL
Condition
Unit
Max
Typ
Min
Symbol
Parameter
V
V
SS
-2.75
-2.25
I
DD
15
mA
I
SS
15
mA
V
V
V
OH
V
OL
V-1
DD
V+1
SS
V
V
With R = 24kW
connected to V
SS
Reference to V
SS
µA
V
45
1.1
55
1.3
-I
R
V
R
50
V
IH
V
IL
V-1
DD
V+1
SS
Operating temp. Range
Supply Voltage: Positive
Supply Voltage: Negative
Supply Current: Negative
Supply Current: Positive
Current Sensor Inputs (Differential)
Input Current Range
Voltage Sensor Inputs (Asymmetrical)
Input Current Range
Ref. Current
Ref. Voltage
Digital I/O
Pin MOP, MON, LED, PH/DIR,
PH1, PH2, PH3
Output High Voltage
Output Low Voltage
Pins RA, RE, IM, TEST
Input Low Voltage
Input High Voltage
mA
mA
I
IH
-I
IL
Pins RA, RE, IM
Pin scan current*
3.1
2
7
4.6
V = V
IDD
VV
SS
=
I
µA
I
IH
Pin TEST
Pull down current
48
110
V = V
IDD
Pin VREF
*Stresses above those listed under “Absolute Maximum Ratings” may cause permanent
damage to the device. This is a stress rating only. Functional operation of the device at these
or any other condition above those indicated in the operational sections of this specification, is
not implied. Exposure to Absolute Maximum Ratings for extended periods may affect device
reliability.


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