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TLP751 Scheda tecnica(PDF) 4 Page - Toshiba Semiconductor |
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TLP751 Scheda tecnica(HTML) 4 Page - Toshiba Semiconductor |
4 / 7 page TLP751 2007-10-01 4 (Note 8) CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic low state(VO < 0.8V). CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic high state(VO > 2.0V). (Note 9) Maximum electrostatic discharge voltage for any pins: 100V (C = 200pF, R = 0). Test Circuit 1 : Switching Time Test Circuit Test Circuit 2 : Common Mode Noise Immunity Test Circuit |
Codice articolo simile - TLP751_07 |
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Descrizione simile - TLP751_07 |
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