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TLP2066 Scheda tecnica(PDF) 5 Page - Toshiba Semiconductor |
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TLP2066 Scheda tecnica(HTML) 5 Page - Toshiba Semiconductor |
5 / 6 page TLP2066 2007-11-20 5 TEST CIRCUIT 5: tpHL , tpLH TEST CIRCUIT 6: tpHL, tpLH TEST CIRCUIT 7: Common-Mode Transient Immunity Test Circuit CM L CM H 10% 90% 1000V ・SW B: IF=0mA 0.8V 2V tr tf ・SW A: IF=12mA s) tr( 800(V) H CM μ = ) ( s tf 800(V) L CM μ = 0.1uF VO V CC SW IF 1 3 6 5 4 VCM B → VCC GND SHIELD A CL is capacitance of the probe and JIG. (P.G): Pulse Generator IF=12mA (P.G) (f=5MHz, duty=50% tr =tf =5ns) 0.1uF VCC RIN=100Ω INPUT MONITORING NODE CL=15pF CL=15pF Vo MONITORING NODE VCC GND SHIELD VIN=3.3V (P.G) (f=5MHz, duty=50% tr = tf =5ns) 0.1uF VCC RIN=220Ω CIN=47pF CL=15pF CL is capacitance of the probe and JIG. Vo MONITORING NODE CL=15pF INPUT MONITORING NODE (P.G): Pulse Generator VCC GND SHIELD tpHL tpLH IF 1.5V V O 50% VOL VOH tf tr 10% 90% tpHL tpLH VIN 1.5V V O 50% VOL VOH tf tr 10% 90% |
Codice articolo simile - TLP2066 |
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Descrizione simile - TLP2066 |
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