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74LVC1G80 Scheda tecnica(PDF) 9 Page - NXP Semiconductors

Il numero della parte 74LVC1G80
Spiegazioni elettronici  Single D-type flip-flop; positive-edge trigger
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Produttore elettronici  NXP [NXP Semiconductors]
Homepage  http://www.nxp.com
Logo NXP - NXP Semiconductors

74LVC1G80 Scheda tecnica(HTML) 9 Page - NXP Semiconductors

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74LVC1G80_8
© NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 08 — 29 August 2007
9 of 16
NXP Semiconductors
74LVC1G80
Single D-type flip-flop; positive-edge trigger
Table 9.
Measurement points
Supply voltage
Input
Output
VCC
VM
VM
1.65 V to 1.95 V
0.5
× V
CC
0.5
× V
CC
2.3 V to 2.7 V
0.5
× V
CC
0.5
× V
CC
2.7 V
1.5 V
1.5 V
3.0 V to 3.6 V
1.5 V
1.5 V
4.5 V to 5.5 V
0.5
× VCC
0.5
× V
CC
Test data is given in Table 10.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to the output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 9.
Load circuitry for switching times
VEXT
VCC
VI
VO
mna616
DUT
CL
RT
RL
RL
G
Table 10.
Test data
Supply voltage
Input
Load
VEXT
VCC
VI
tr =tf
CL
RL
tPLH, tPHL
1.65 V to 1.95 V
VCC
≤ 2.0 ns
30 pF
1 k
open
2.3 V to 2.7 V
VCC
≤ 2.0 ns
30 pF
500
open
2.7 V
2.7 V
≤ 2.5 ns
50 pF
500
open
3.0 V to 3.6 V
2.7 V
≤ 2.5 ns
50 pF
500
open
4.5 V to 5.5 V
VCC
≤ 2.5 ns
50 pF
500
open


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