Motore di ricerca datesheet componenti elettronici
  Italian  ▼
ALLDATASHEETIT.COM

X  

SN74BCT8244ANTE4 Scheda tecnica(PDF) 4 Page - Texas Instruments

Il numero della parte SN74BCT8244ANTE4
Spiegazioni elettronici  SCAN TEST DEVICES WITH OCTAL BUFFERS
Download  28 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Produttore elettronici  TI [Texas Instruments]
Homepage  http://www.ti.com
Logo TI - Texas Instruments

SN74BCT8244ANTE4 Scheda tecnica(HTML) 4 Page - Texas Instruments

  SN74BCT8244ANTE4 Datasheet HTML 1Page - Texas Instruments SN74BCT8244ANTE4 Datasheet HTML 2Page - Texas Instruments SN74BCT8244ANTE4 Datasheet HTML 3Page - Texas Instruments SN74BCT8244ANTE4 Datasheet HTML 4Page - Texas Instruments SN74BCT8244ANTE4 Datasheet HTML 5Page - Texas Instruments SN74BCT8244ANTE4 Datasheet HTML 6Page - Texas Instruments SN74BCT8244ANTE4 Datasheet HTML 7Page - Texas Instruments SN74BCT8244ANTE4 Datasheet HTML 8Page - Texas Instruments SN74BCT8244ANTE4 Datasheet HTML 9Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 4 / 28 page
background image
SN54BCT8244A, SN74BCT8244A
SCAN TEST DEVICES
WITH OCTAL BUFFERS
SCBS042E – FEBRUARY 1990 – REVISED JULY 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL NAME
DESCRIPTION
1A1–1A4, 2A1–2A4
Normal-function data inputs. See function table for normal-mode logic. Internal pullups force these inputs high if left
unconnected.
GND
Ground
1OE, 2OE
Normal-function output-enable inputs. See function table for normal-mode logic. Internal pullups force these inputs
high if left unconnected.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are
synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An
internal pullup forces TCK to a high level if left unconnected.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting
data through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is
not active and is not driven from an external source.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its
TAP controller states. An internal pullup forces TMS to a high level if left unconnected. TMS also provides the optional
test reset signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double high
(VIHH), at TMS.
VCC
Supply voltage
1Y1–1Y4, 2Y1–2Y4
Normal-function data outputs. See function table for normal-mode logic.


Codice articolo simile - SN74BCT8244ANTE4

Produttore elettroniciIl numero della parteScheda tecnicaSpiegazioni elettronici
logo
Texas Instruments
SN74BCT8244ANTE4 TI-SN74BCT8244ANTE4 Datasheet
472Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN74BCT8244ANTE4 TI-SN74BCT8244ANTE4 Datasheet
642Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
More results

Descrizione simile - SN74BCT8244ANTE4

Produttore elettroniciIl numero della parteScheda tecnicaSpiegazioni elettronici
logo
Texas Instruments
SN54BCT8244A TI-SN54BCT8244A Datasheet
472Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8244A TI-SN54BCT8244A_08 Datasheet
642Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUFFERS
SN54BCT8240A TI-SN54BCT8240A Datasheet
473Kb / 26P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS
SN54BCT8245A TI-SN54BCT8245A Datasheet
309Kb / 22P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_07 Datasheet
635Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54BCT8245A TI-SN54BCT8245A_08 Datasheet
658Kb / 29P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_08 Datasheet
665Kb / 30P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245 Datasheet
364Kb / 25P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8245 TI-SN54ABT8245_06 Datasheet
483Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS
SN54ABT8543 TI-SN54ABT8543 Datasheet
357Kb / 25P
[Old version datasheet]   SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28


Scheda tecnica Scarica

Go To PDF Page


Link URL




Privacy Policy
ALLDATASHEETIT.COM
Lei ha avuto il aiuto da alldatasheet?  [ DONATE ] 

Di alldatasheet   |   Richest di pubblicita   |   contatti   |   Privacy Policy   |   scambio Link   |   Ricerca produttore
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com