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SN74BCT8244ANTE4 Scheda tecnica(PDF) 4 Page - Texas Instruments |
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SN74BCT8244ANTE4 Scheda tecnica(HTML) 4 Page - Texas Instruments |
4 / 28 page SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Terminal Functions TERMINAL NAME DESCRIPTION 1A1–1A4, 2A1–2A4 Normal-function data inputs. See function table for normal-mode logic. Internal pullups force these inputs high if left unconnected. GND Ground 1OE, 2OE Normal-function output-enable inputs. See function table for normal-mode logic. Internal pullups force these inputs high if left unconnected. TCK Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An internal pullup forces TCK to a high level if left unconnected. TDI Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected. TDO Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is not active and is not driven from an external source. TMS Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP controller states. An internal pullup forces TMS to a high level if left unconnected. TMS also provides the optional test reset signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double high (VIHH), at TMS. VCC Supply voltage 1Y1–1Y4, 2Y1–2Y4 Normal-function data outputs. See function table for normal-mode logic. |
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