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AM70PDL127BDH66IT Scheda tecnica(PDF) 6 Page - SPANSION |
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AM70PDL127BDH66IT Scheda tecnica(HTML) 6 Page - SPANSION |
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6 / 128 page  4 Am70PDL127BDH/Am70PDL129BDH November 25, 2003 AD VAN C E INFORM ATION GENERAL DESCRIPTION (PDL127) The Am29PDL127H is a 128 Mbit, 3.0 volt-only Page Mode and Simultaneous Read/Write Flash memory device orga- nized as 8 Mwords. The word-wide data (x16) appears on DQ15-DQ0. This device can be programmed in-system or in standard EPROM programmers. A 12.0 V V PP is not required for write or erase operations. The device offers fast page access time of 25 and 30 ns, with corresponding random access times of 65 and 85 ns, respectively, allowing high speed microprocessors to oper- ate without wait states. To eliminate bus contention the de- vice has separate chip enable (CE#f1), write enable (WE#) and output enable (OE#) controls. Simultaneous Read/Write Operation with Zero Latency The Simultaneous Read/Write architecture provides simul- taneous operation by dividing the memory space into 4 banks, which can be considered to be four separate memory arrays as far as certain operations are concerned. The de- vice can improve overall system performance by allowing a host system to program or erase in one bank, then immedi- ately and simultaneously read from another bank with zero latency (with two simultaneous operations operating at any one time). This releases the system from waiting for the completion of a program or erase operation, greatly improv- ing system performance. The device can be organized in both top and bottom sector configurations. The banks are organized as follows: Page Mode Features The page size is 8 words. After initial page access is accom- plished, the page mode operation provides fast read access speed of random locations within that page. Standard Flash Memory Features The device requires a single 3.0 volt power supply (2.7 V to 3.3 V) for both read and write functions. Internally gener- ated and regulated voltages are provided for the program and erase operations. The device is entirely command set compatible with the JEDEC 42.4 single-power-supply Flash standard. Com- mands are written to the command register using standard microprocessor write timing. Register contents serve as in- puts to an internal state-machine that controls the erase and programming circuitry. Write cycles also internally latch ad- dresses and data needed for the programming and erase operations. Reading data out of the device is similar to read- ing from other Flash or EPROM devices. Device programming occurs by executing the program com- mand sequence. The Unlock Bypass mode facilitates faster programming times by requiring only two write cycles to pro- gram data instead of four. Device erasure occurs by execut- ing the erase command sequence. The host system can detect whether a program or erase op- eration is complete by reading the DQ7 (Data# Polling) and DQ6 (toggle) status bits. After a program or erase cycle has been completed, the device is ready to read array data or ac- cept another command. The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data con- tents of other sectors. The device is fully erased when shipped from the factory. Hardware data protection measures include a low V CC de- tector that automatically inhibits write operations during power transitions. The hardware sector protection feature disables both program and erase operations in any combina- tion of sectors of memory. This can be achieved in-system or via programming equipment. The Erase Suspend/Erase Resume feature enables the user to put erase on hold for any period of time to read data from, or program data to, any sector that is not selected for erasure. True background erase can thus be achieved. If a read is needed from the SecSi Sector area (One Time Pro- gram area) after an erase suspend, then the user must use the proper command sequence to enter and exit this region. The device offers two power-saving features. When ad- dresses have been stable for a specified amount of time, the device enters the automatic sleep mode. The system can also place the device into the standby mode. Power con- sumption is greatly reduced in both these modes. AMD’s Flash technology combined years of Flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness. The device electri- cally erases all bits within a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron injection. Bank Sectors A 16 Mbit (4 Kw x 8 and 32 Kw x 31) B 48 Mbit (32 Kw x 96) C 48 Mbit (32 Kw x 96) D 16 Mbit (4 Kw x 8 and 32 Kw x 31) |
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