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TLP701 Scheda tecnica(PDF) 4 Page - Toshiba Semiconductor |
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TLP701 Scheda tecnica(HTML) 4 Page - Toshiba Semiconductor |
4 / 8 page TLP701 2006-01-17 4 Switching Characteristics (Ta = −40 to 100 °C, unless otherwise specified) Characteristics Symbol Test Circuit Test Condition Min Typ.* Max Unit L → H tpLH IF = 0 → 5 mA 100 ⎯ 700 Propagation delay time H → L tpHL IF = 5 → 0 mA 100 ⎯ 700 Output rise time (10 −90 %) tr IF = 0 → 5 mA ⎯ 50 ⎯ Output fall time (90 −10 %) tf IF = 5 → 0 mA ⎯ 50 ⎯ Switching time dispersion between ON and OFF | tpHL-tpLH | 7 VCC = 30 V Rg = 47 Ω Cg = 3 nF IF = 0 , 5 mA −500 ⎯ 500 ns Common mode transient immunity at HIGH level output CMH IF = 5 mA VO (min) = 26 V −10000 ⎯ ⎯ Common mode transient immunity at LOW level output CML 8 VCM =1000 Vp-p VCC = 30 V Ta = 25 °C IF = 0 mA VO (max) = 1 V 10000 ⎯ ⎯ V/ µs ( * ): All typical values are at Ta = 25 °C. Test Circuit 1: IOPH Test Circuit 2: IOPL Test Circuit 3: VOH Test Circuit 4: VOL Test Circuit 5: ICCH Test Circuit 6: ICCL A IOPL V5-4 VCC 1 3 4 6 0.1 µF A IF 1 3 4 6 IOPH V6-5 VCC 0.1 µF V VCC VOH IF 1 3 4 6 IO 0.1 µF VOL VCC V VF 1 3 4 6 IO 0.1 µF VCC A ICCH IF 1 3 4 6 0.1 µF VCC A ICCL 1 3 4 6 0.1 µF |
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