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74ALVCH16244 Scheda tecnica(PDF) 4 Page - NXP Semiconductors

Il numero della parte 74ALVCH16244
Spiegazioni elettronici  2.5V/3.3V 16-bit buffer/line driver 3-State
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Produttore elettronici  PHILIPS [NXP Semiconductors]
Homepage  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74ALVCH16244 Scheda tecnica(HTML) 4 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74ALVC16244/
74ALVCH16244
16-bit buffer/line driver (3-State)
1998 Jun 29
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
UNIT
DC supply voltage 2.5V range (for max. speed
performance @ 30 pF output load)
2.3
2.7
VCC
DC supply voltage 3.3V range (for max. speed
performance @ 50 pF output load)
3.0
3.6
V
DC supply voltage (for low-voltage applications)
1.2
3.6
For data input pins with
bus hold
0
VCC
VI
DC Input voltage range
For data input pins without
bus hold
0
5.5
V
For control pins
0
5.5
VO
DC output voltage range
0
VCC
V
Tamb
Operating free-air temperature range
–40
+85
°C
tr, tf
Input rise and fall times
VCC = 2.3 to 3.0V
VCC = 3.0 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS1
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
–0.5 to +4.6
V
IIK
DC input diode current
VI t0
–50
mA
For data inputs with bus hold2
–0.5 to VCC +0.5
VI
DC input voltage
For data inputs without bus hold2
–0.5 to +5.5
V
For control pins2
–0.5 to +5.5
IOK
DC output diode current
VO uVCC or VO t 0
"50
mA
VO
DC output voltage
Note 2
–0.5 to VCC +0.5
V
IO
DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC
DC VCC or GND current
"100
mA
Tstg
Storage temperature range
–65 to +150
°C
PTOT
Power dissipation per package
–plastic medium-shrink (SSOP)
–plastic thin-medium-shrink (TSSOP)
For temperature range: –40 to +125
°C
above +55
°C derate linearly with 11.3 mW/K
above +55
°C derate linearly with 8 mW/K
850
600
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.


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