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MC78T00 Scheda tecnica(PDF) 4 Page - ON Semiconductor |
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MC78T00 Scheda tecnica(HTML) 4 Page - ON Semiconductor |
4 / 12 page MC78T00 Series 4 MOTOROLA ANALOG IC DEVICE DATA ELECTRICAL CHARACTERISTICS (Vin = 17 V, IO = 3.0 A, 0°C ≤ TJ ≤ 125°C, PO ≤ Pmax [Note 1], unless otherwise noted.) MC78T12AC MC78T12C Characteristics Symbol Min Typ Max Min Typ Max Unit Output Voltage (5.0 mA ≤ IO ≤ 3.0 A, TJ = +25°C) (5.0 mA ≤ IO ≤ 3.0 A, 5.0 mA ≤ IO ≤ 2.0 A, 14.5 Vdc ≤ Vin ≤ 27 Vdc) VO 11.75 11.5 12 12 12.25 12.5 11.5 11.4 12 12 12.5 12.6 Vdc Line Regulation (Note 2) (14.5 Vdc ≤ Vin ≤ 35 Vdc, IO = 5.0 mA, TJ = +25°C; 14.5 Vdc ≤ Vin ≤ 35 Vdc, IO = 1.0 A, TJ = +25°C; 16 Vdc ≤ Vin ≤ 22 Vdc, IO = 3.0 A, TJ = +25°C; 14.9 Vdc ≤ Vin ≤ 27 Vdc, IO = 1.0 A) Regline – 6.0 45 – 6.0 45 mV Load Regulation (Note 2) (5.0 mA ≤ IO ≤ 3.0 A, TJ = +25°C) (5.0 mA ≤ IO ≤ 3.0 A) Regload – – 10 15 30 80 – – 10 15 30 80 mV Thermal Regulation (Pulse = 10 ms, P = 20 W, TA = +25°C) Regtherm – 0.001 0.01 – 0.002 0.03 %VO/W Quiescent Current (5.0 mA ≤ IO ≤ 3.0 A, TJ = +25°C) (5.0 mA ≤ IO ≤ 3.0 A) IB – – 3.5 4.0 5.0 6.0 – – 3.5 4.0 5.0 6.0 mA Quiescent Current Change (14.5 Vdc ≤ Vin ≤ 35 Vdc, IO = 5.0 mA, TJ = +25°C; 5.0 mA ≤ IO ≤ 3.0 A, TJ = +25°C; 14.9 Vdc ≤ Vin ≤ 27 Vdc, IO = 1.0 A) ∆IB – 0.3 1.0 – 0.3 1.0 mA Ripple Rejection (15 Vdc ≤ Vin ≤ 25 Vdc, f = 120 Hz, IO = 2.0 A, TJ = 25°C) RR 57 67 – 57 67 – dB Dropout Voltage (IO = 3.0 A, TJ = +25°C) Vin – VO – 2.2 2.5 – 2.2 2.5 Vdc Output Noise Voltage (10 Hz ≤ f ≤ 100 kHz, TJ = +25°C) Vn – 10 – – 10 – µV/VO Output Resistance (f = 1.0 kHz) RO – 2.0 – – 20 – m Ω Short Circuit Current Limit (Vin = 35 Vdc, TJ = +25°C) ISC – 1.5 – – 1.5 – A Peak Output Current (TJ = +25°C) Imax – 5.0 – – 5.0 – A Average Temperature Coefficient of Output Voltage (IO = 5.0 mA) TCVO – 0.5 – – 0.5 – mV/ °C NOTES: 1. Although power dissipation is internally limited, specifications apply only for PO ≤ Pmax, Pmax = 25 W. 2. Line and load regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account separately. Pulse testing with low duty cycle is used. |
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