9

Package Characteristics

Notes:

with respect to GND1 an internal optical-

coupling test mode may be activated. This

test mode is not intended for customer use.

2. Agilent recommends the use of non-

chlorinated solder fluxes.

3. Because of the switched-capacitor nature of

the isolated modulator, time averaged

values are shown.

respect to input ground GND1.

5. Short-circuit current is the amount of output

current generated when either output is

conditions is not recommended.

6. Data hold time is amount of time that the

data output MDAT will stay stable following

the rising edge of output clock MCLK.

7. Resolution is defined as the total number of

output bits. The useable accuracy of any A/

D converter is a function of its linearity and

signal-to-noise ratio, rather than how many

total bits it has.

8. Integral nonlinearity is defined as one-half

the peak-to-peak deviation of the best-fit

200 mV to +200 mV, expressed either as the

number of LSBs or as a percent of measured

input range (400 mV).

9. Differential nonlinearity is defined as the

deviation of the actual difference from the

ideal difference between midpoints of

successive output codes, expressed in

LSBs.

10. Data sheet value is the average magnitude

per °C. Three standard deviation from

typical value is less than 6

µV/°C.

11. Beyond the full-scale input range the output

is either all zeroes or all ones.

12. The effective number of bits (or effective

resolution) is defined by the equation ENOB

= (SNR-1.76)/6.02 and represents the

resolution of an ideal, quantization-noise

limited A/D converter with the same SNR.

13. Conversion time is defined as the time from

when the convert start signal CS is brought

low to when SDAT goes high, indicating that

output data is ready to be clocked out. This

can be as small as a few cycles of the

isolated modulator clock and is determined

by the frequency of the isolated modulator

clock and the selected Conversion and Pre-

Trigger modes. For determining the true

signal delay characteristics of the A/D

converter for closed-loop phase margin

calculations, the signal delay specification

should be used.

14. Signal delay is defined as the effective delay

of the input signal through the Isolated A/D

converter. It can be measured by applying a

-200 mV to ± 200 mV step at the input of

modulator and adjusting the relative delay of

the convert start signal CS so that the

output of the converter is at mid scale. The

signal delay is the elapsed time from when

the step signal is applied at the input to

when output data is ready at the end of the

conversion cycle. The signal delay is the

most important specification for

determining the true signal delay

characteristics of the A/D converter and

should be used for determining phase

margins in closed-loop applications. The

signal delay is determined by the frequency

of the modulator clock and which

Conversion Mode is selected, and is

independent of the selected Pre-Trigger

Mode and, therefore, conversion time.

15. The minimum and maximum overrange

detection time is determined by the

frequency of the channel 1 isolated

modulator clock.

16. The minimum and maximum threshold

detection time is determined by the user-

defined configuration of the adjustable

threshold detection circuit and the

frequency of the channel 1 isolated

modulator clock. See the Applications

Information section for further detail. The

specified times apply for the default

configuration.

17. The signal bandwidth is the frequency at

which the magnitude of the output signal

has decreased 3 dB below its low-frequency

value. The signal bandwidth is determined

by the frequency of the modulator clock and

the selected Conversion Mode.

18. The isolation transient immunity (also

known as Common-Mode Rejection)

specifies the minimum rate-of-rise of an

isolation-mode signal applied across the

isolation boundary beyond which the

modulator clock or data signals are

corrupted.

19. In accordance with UL1577, for devices with

isolated modulator (optocoupler) is proof-

tested by applying an insulation test voltage

This test is performed before the Method b,

100% production test for partial discharge

shown in IEC/EN/DIN EN 60747-5-2

Insulation Characteristics Table.

20. This is a two-terminal measurement: pins 1-

4 are shorted together and pins 5-8 are

shorted together.

*The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-

output continuous voltage rating. For the continuous voltage rating refer to the IEC/EN/DIN EN 60747-5-2 Insulation

Characteristics Table (if applicable), your equipment level safety specification, or Agilent Application Note 1074,

“Optocoupler Input-Output Endurance Voltage.”

Parameter

Symbol

Min.

Typ.

Max.

Units

Conditions

Note

Input-Output Momentary

Withstand Voltage*

3750

RH

≤ 50%, t = 1

19, 20

Input-Output Resistance

Ω

20

Input-Output Capacitance

1.4

pF

f = 1 MHz

20

Input IC Junction-to-Case

Thermal Resistance

θ

jci

96

°C/W

Thermocouple located at

center underside of package

Output IC Junction-to-Case

Thermal Resistance

θ

jco

114

°C/W