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AD5426YRM-REEL7 Scheda tecnica(PDF) 11 Page - Analog Devices |
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AD5426YRM-REEL7 Scheda tecnica(HTML) 11 Page - Analog Devices |
11 / 24 page REV. 0 AD5426/AD5432/AD5443 –11– TERMINOLOGY Relative Accuracy Relative accuracy or endpoint nonlinearity is a measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is measured after adjusting for 0 and full scale and is normally expressed in LSBs or as a percentage of full-scale reading. Differential Nonlinearity Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of –1 LSB max over the operating temperature range ensures monotonicity. Gain Error Gain error or full-scale error is a measure of the output error between an ideal DAC and the actual device output. For these DACs, ideal maximum output is VREF – 1 LSB. Gain error of the DACs is adjustable to 0 with external resistance. Output Leakage Current Output leakage current is current that flows in the DAC ladder switches when these are turned off. For the IOUT1 terminal, it can be measured by loading all 0s to the DAC and measuring the IOUT1 current. Minimum current will flow in the IOUT2 line when the DAC is loaded with all 1s. Output Capacitance Capacitance from IOUT1 or IOUT2 to AGND. Output Current Settling Time This is the amount of time it takes for the output to settle to a specified level for a full scale input change. For these devices, it is specified with a 100 Ω resistor to ground. The settling time specification includes the digital delay from SYNC rising edge to the full-scale output charge. Digital to Analog Glitch Impulse The amount of charge injected from the digital inputs to the analog output when the inputs change state. This is normally specified as the area of the glitch in either pA-secs or nV-secs depending upon whether the glitch is measured as a current or voltage signal. Digital Feedthrough When the device is not selected, high frequency logic activity on the device digital inputs may be capacitively coupled through the device to show up as noise on the IOUT pins and subsequently into the following circuitry. This noise is digital feedthrough. Multiplying Feedthrough Error This is the error due to capacitive feedthrough from the DAC reference input to the DAC IOUT1 terminal, when all 0s are loaded to the DAC. Total Harmonic Distortion (THD) The DAC is driven by an ac reference. The ratio of the rms sum of the harmonics of the DAC output to the fundamental value is the THD. Usually only the lower order harmonics are included, such as second to fifth. THD VVV V V = ++ + () 20 2 2 3 2 4 2 5 2 1 log Digital Intermodulation Distortion Second-order intermodulation distortion (IMD) measurements are the relative magnitude of the fa and fb tones generated digi- tally by the DAC and the second-order products at 2fa – fb and 2fb – fa. Spurious-Free Dynamic Range (SFDR) It is the usable dynamic range of a DAC before spurious noise interferes or distorts the fundamental signal. SFDR is the mea- sure of difference in amplitude between the fundamental and the largest harmonically or nonharmonically related spur from dc to full Nyquist bandwidth (half the DAC sampling rate, or fS/2). Narrow band SFDR is a measure of SFDR over an arbi- trary window size, in this case 50% of the fundamental. Digital SFDR is a measure of the usable dynamic range of the DAC when the signal is digitally generated sine wave. |
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