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MC100EP139MNG Scheda tecnica(PDF) 8 Page - ON Semiconductor |
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MC100EP139MNG Scheda tecnica(HTML) 8 Page - ON Semiconductor |
8 / 14 page MC10EP139, MC100EP139 www.onsemi.com 8 Table 11. AC CHARACTERISTICS (VCC = 0 V; VEE = −3.0 V to −5.5 V or VCC = 3.0 V to 5.5 V; VEE = 0 V (Note 1)) −40°C 25°C 85°C Symbol Characteristic Min Typ Max Min Typ Max Min Typ Max Unit fmax Maximum Frequency (See Figures 6, 7, 8 and 9 Fmax /JITTER) > 1 > 1 > 1 GHz tPLH, tPHL Propagation Delay CLK, Q (Diff) MR, Q 550 700 700 800 800 900 600 700 750 850 900 1000 675 800 825 950 975 1100 ps tRR Reset Recovery 200 100 200 100 200 100 ps ts Setup Time EN, CLK DIVSEL, CLK 200 400 120 180 200 400 120 180 200 400 120 180 ps th Hold Time CLK, EN CLK, DIVSEL 100 200 50 140 100 200 50 140 100 200 50 140 ps tPW Minimum Pulse Width MR 550 450 550 450 550 450 ps tSKEW Within Device Skew Q, Q Device-to-Device Skew (Note 2) 50 200 100 300 50 200 100 300 50 200 100 300 ps tJITTER Random Clock Jitter (RMS) (See Figures 6, 7, 8 and 9 Fmax/JIT- TER) 0.2 < 1.0 0.2 < 1.0 0.2 < 1.5 ps VPP Input Voltage Swing (Differential Con- figuration) 150 800 1200 150 800 1200 150 800 1200 mV tr tf Output Rise/Fall Times Q, Q (20%−80%) 110 180 250 125 190 275 150 215 300 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 1. Measured using a 750 mV source, 50% duty cycle clock source. All loading with 50 W to VCC − 2.0 V (see Figure 10). 2. Skew is measured between outputs under identical transitions. Duty cycle skew is defined only for differential operation when the delays are measured from the cross point of the inputs to the cross point of the outputs. Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. |
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