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Formosa MS

Dual NPN Epitaxial Planar Transistor

Document ID

Issued Date

Revised Date

Revision

Page.

DS-231148

2009/08/10

2010/05/10

B

10

High reliability test capabilities

1.

2.

3.

4.

5.

6.

7.

8.

Steady State Operating Life

High Temperature Reverse Bias

Temperature Cycle

Autoclave

High Temperature Storage Life

Solderability

High Temperature High Humidity Reverse

Bias

Resistance to Soldering Heat

P =150mW Test Duration:1000hrs

D

Tj= 150℃, V = 80% related volage, 1000hrs

CE

-55℃(15min) to 150℃(15min)Air to Air Transition Time<20sec Test Cycles:1000cycle

P= 2atm Ta= 121℃ RH= 100% Test Duration: 96hrs

Ta= 150℃ Test Duration: 1000hrs

245℃,5sec

Ta= 85℃, 85% RH, V = 80% related volage, 1000hrs

CE

260℃

Item Test

Conditions

FMBT2222ADW1